Unraveling the electric field effect on the grain-boundary migration in alumina through phase field modeling

被引:1
作者
Liang, Shuibao [1 ,2 ]
Zhang, Xin-Ping [1 ,3 ]
机构
[1] South China Univ Technol, Sch Mat Sci & Engn, Guangzhou, Peoples R China
[2] Loughborough Univ, Wolfson Sch Mech Elect & Mfg Engn, Loughborough, England
[3] South China Univ Technol, Sch Mat Sci & Engn, Guangzhou 510640, Peoples R China
基金
中国国家自然科学基金; 国家重点研发计划;
关键词
ceramics; electric field; grain boundary; microstructure; phase field model; GROWTH; MICROSTRUCTURE; DYNAMICS;
D O I
10.1111/jace.18896
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
It is experimentally demonstrated that the electric field drives the grain-boundary (GB) migration in ceramics, but this has not been interpreted mechanistically. This work develops a phase field model to study the GB migration in alumina (Al2O3) and validate through the comparison with previous experiments. Results show that the GBs move to the small grain domain. Under an electric field in the positive bias direction, GB migration is enhanced, whereas the migration to the small grain domain is inhibited under the electric field in the negative bias direction. The enhancement or inhibition effect becomes more pronounced with increasing the electric field. The high negative bias induces decrease in the GB migration velocity even with the migration direction altering. It is revealed that GB migrations are dominated by the competitive effect between the curvature and electric field driving forces, and an analytical expression of the critical electric field is derived.
引用
收藏
页码:1647 / 1652
页数:6
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