Microcontroller-based aging test system design and implementation for medium voltage cables

被引:1
|
作者
Ozer, Tolga [1 ]
Yalman, Yunus [2 ]
Kivrak, Sinan [3 ]
机构
[1] Afyon Kocatepe Univ, Afyon, Turkiye
[2] Ankara Yildirim Beyazit Univ, Ankara, Turkiye
[3] Ostim Tech Univ, Ankara, Turkiye
关键词
Microcontroller; Aging test; AWTT; Water tree; Medium voltage; Current measurement; INSULATION;
D O I
10.1016/j.epsr.2022.108943
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this study, the design and implementation of a new cable test system were carried out for the aging process of medium voltage (MV) cables. Two different pools, medium voltage systems, and microcontroller-based control circuits of these systems were developed for the accelerated water tree test (AWTT) process. Moreover, a new current measurement system was proposed for improve insulation to MV applications. A water aging process was applied to 15 and 36 kV distribution system cables to test the performance of the developed test system. Since the aging test process of the 15 kV cable has been completed, the breakdown voltage of the cable was determined. However, the aging test process for the 36 kV cable continues. The test results show that the AWTT process for two medium voltage cables was carried out successfully by the developed microcontroller-based test system by satisfying the requirement of international standards.
引用
收藏
页数:9
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