A review of intentional electromagnetic interference in power electronics: Conducted and radiated susceptibility

被引:38
作者
Jie, Huamin [1 ]
Zhao, Zhenyu [2 ,4 ]
Zeng, Yu [1 ]
Chang, Yongqi [3 ]
Fan, Fei [1 ]
Wang, Changdong [3 ]
See, Kye Yak [1 ]
机构
[1] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore, Singapore
[2] Natl Univ Singapore, Dept Elect & Comp Engn, Singapore, Singapore
[3] Harbin Inst Technol, Dept Control Sci & Engn, Harbin, Peoples R China
[4] Natl Univ Singapore, Dept Elect & Comp Engn, 4 Engn Dr 3, Singapore 117583, Singapore
关键词
conducted and radiated susceptibility; electromagnetic compatibility standards; intentional electromagnetic interference; power electronics; BULK CURRENT INJECTION; GRID IMPEDANCE ESTIMATION; OF-THE-ART; SHIELDING EFFECTIVENESS; INDUSTRY; 4.0; ANALYTICAL FORMULATION; SIMULATION; MODEL; EMI; CIRCUIT;
D O I
10.1049/pel2.12685
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
With the advancements in Industry 4.0 and the global demand for sustainable energy, power electronics devices are emerging as pivotal components for modern industrial, transportation, and energy delivery. Ensuring the security of these devices is of paramount importance for safeguarding the reliable operation of critical systems against any threats. In recent years, the issue of intentional electromagnetic interference (IEMI) attack and their related countermeasures have gained widespread attention in both military and civilian power electronics sectors. Here, a review of IEMI in power electronics is provided. Starting from the electromagnetic compatibility standards, the test setups for evaluating the device immunity are introduced. Due to different attack modes and propagation paths, IEMI illuminations are typically categorized into conduction and radiation, where their susceptibility studies, applications, and defence strategies are discussed, respectively. Finally, the existing challenges, ongoing trends, and future topics in this field are discussed. This article conducts a thorough review of relevant literature as well as the electromagnetic susceptibility standards over the past two decades. Various test setups and methods are introduced, targeting the conducted susceptibility and radiated susceptibility of power electronics devices. image
引用
收藏
页码:1487 / 1506
页数:20
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