Effect of Air Exposure on Electron-Beam-Induced Degradation of Perovskite Films

被引:5
|
作者
Sharma, Romika [1 ]
Zhang, Qiannan [2 ]
Linh Lan Nguyen [1 ]
Salim, Teddy [1 ]
Lam, Yeng Ming [1 ]
Sum, Tze Chien [2 ]
Duchamp, Martial [1 ]
机构
[1] Nanyang Technol Univ, Sch Mat Sci & Engn, Singapore 639798, Singapore
[2] Nanyang Technol Univ, Sch Phys & Math Sci, Singapore 637371, Singapore
来源
ACS NANOSCIENCE AU | 2023年 / 3卷 / 03期
关键词
organic-inorganic halide perovskites; transmission; electron microscopy; time-resolved photoluminescence; X-ray photoelectron spectroscopy; microstructural changes;
D O I
10.1021/acsnanoscienceau.2c00065
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Organic-inorganic halide perovskites are interesting candidates for solar cell and optoelectronic applications owing to their advantageous properties such as a tunable band gap, low material cost, and high charge carrier mobilities. Despite making significant progress, concerns about material stability continue to impede the commercialization of perovskite-based technology. In this article, we investigate the impact of environmental parameters on the alteration of structural properties of MAPbI3 (CH3NH3PbI3) thin films using microscopy techniques. These characterizations are performed on MAPbI3 thin films exposed to air, nitrogen, and vacuum environments, the latter being possible by using dedicated air-free transfer setups, after their fabrication into a nitrogen-filled glovebox. We observed that even less than 3 min of air exposure increases the sensitivity to electron beam deterioration and modifies the structural transformation pathway as compared to MAPbI3 thin films which are not exposed to air. Similarly, the time evolution of the optical responses and the defect formation of both air-exposed and non-air-exposed MAPbI3 thin films are measured by time-resolved photoluminescence. The formation of defects in the air-exposed MAPbI3 thin films is first observed by optical techniques at longer timescales, while structural modifications are observed by transmission electron microscopy (TEM) measurements and supported by X-ray photoelectron spectroscopy (XPS) measurements. Based on the complementarity of TEM, XPS, and time-resolved optical measurements, we propose two different degradation mechanism pathways for air-exposed and non-air-exposed MAPbI3 thin films. We find that when exposed to air, the crystalline structure of MAPbI3 shows gradual evolution from its initial tetragonal MAPbI3 structure to PbI2 through three different stages. No significant structural changes over time from the initial structure are observed for the MAPbI3 thin films which are not exposed to air.
引用
收藏
页码:230 / 240
页数:11
相关论文
共 50 条
  • [1] Electron-beam-induced degradation of halide-perovskite-related semiconductor nanomaterials
    Dang, Zhiya
    Luo, Yuqing
    Wang, Xue-Sen
    Imran, Muhammad
    Gao, Pingqi
    CHINESE OPTICS LETTERS, 2021, 19 (03)
  • [2] Electron-beam-induced degradation of halide-perovskite-related semiconductor nanomaterials
    党志亚
    罗余庆
    王学森
    Muhammad Imran
    高平奇
    ChineseOpticsLetters, 2021, 19 (03) : 12 - 16
  • [3] Mechanisms of Electron-Beam-Induced Damage in Perovskite Thin Films Revealed by Cathodoluminescence Spectroscopy
    Xiao, Chuanxiao
    Li, Zhen
    Guthrey, Harvey
    Moseley, John
    Yang, Ye
    Wozny, Sarah
    Moutinho, Helio
    To, Bobby
    Berry, Joseph J.
    Gorman, Brian
    Yan, Yanfa
    Zhu, Kai
    Al-Jassimt, Mowafak
    JOURNAL OF PHYSICAL CHEMISTRY C, 2015, 119 (48): : 26904 - 26911
  • [4] Electron-beam-induced cracking in organic-inorganic halide perovskite thin films
    Yadavalli, Srinivas K.
    Chen, Min
    Hu, Mingyu
    Dai, Zhenghong
    Zhou, Yuanyuan
    Padture, Nitin P.
    SCRIPTA MATERIALIA, 2020, 187 : 88 - 92
  • [5] ELECTRON-BEAM-INDUCED CONDUCTION IN POLYETHYLENE TEREPHTHALATE FILMS
    BECKLEY, LM
    LEWIS, TJ
    TAYLOR, DM
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1976, 9 (09) : 1355 - 1365
  • [6] ELECTRON-BEAM-INDUCED CONDUCTIVITY IN THIN INSULATING FILMS
    TAYLOR, DM
    RADIATION PHYSICS AND CHEMISTRY, 1979, 13 (5-6) : 209 - 221
  • [7] Proximity effect in electron-beam-induced deposition
    Mitsuishi, Kazutaka
    Shimojo, Masayuki
    Takeguchi, Masaki
    Tanaka, Miyoko
    Furuya, Kazuo
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2006, 45 (6B): : 5517 - 5521
  • [8] ELECTRON-BEAM-INDUCED CONDUCTIVITY AND RELATED PROCESSES IN INSULATING FILMS
    TAYLOR, DM
    IEE PROCEEDINGS-A-SCIENCE MEASUREMENT AND TECHNOLOGY, 1981, 128 (03): : 174 - 182
  • [9] Investigation of nitride films by the electron-beam-induced current method
    Yakimov E.B.
    Journal of Surface Investigation, 2015, 9 (05): : 939 - 943
  • [10] ELECTRON-BEAM-INDUCED FUSION
    YONAS, G
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1974, 19 (01): : 85 - 85