Influence of the Device Structure on the Electrical and Photodetector Properties of n-MoS2/p-GaSe Heterojunction Optoelectronic Devices

被引:6
|
作者
Wu, Xiaoxiang [1 ,2 ]
Guo, Wenxuan [1 ,2 ]
Li, Mengge [1 ,2 ]
Xiao, Cong [1 ,2 ]
Ou, Tianjian [1 ,2 ]
Qiu, Zhanjie [1 ,2 ]
Wang, Yewu [1 ,2 ,3 ]
机构
[1] Zhejiang Univ, Dept Phys, Zhejiang Prov Key Lab Quantum Technol & Devices, Hangzhou 310027, Peoples R China
[2] Zhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
[3] Nanjing Univ, Collaborat Innovat Ctr Adv Microstruct, Nanjing 210093, Peoples R China
基金
中国国家自然科学基金;
关键词
GaSe; MoS2; van der Waalsheterojunction; device structure; optoelectronicdevice; PERFORMANCE; GAS;
D O I
10.1021/acsanm.3c01376
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Van der Waals heterojunction devicesare of great significancefor developing high-performance optoelectronic devices. Here, a strategyhas been introduced to effectively improve the performance of devicesby designing their structure, and three types of devices based onMoS(2)/GaSe heterojunctions were designed and fabricated.The results have demonstrated that device-III effectively decreasesthe recombination of the electrons in GaSe flakes by removing thenon-heterojunction region and depleting the GaSe flake, which resultsin electron-dominated channel current and much better electrical performancethan device-I and device-II, such as a larger rectification ratioof 1.6 x 10(5) and an ideality factor of 1.06. Furthermore,a photodetector based on device-III exhibits high performance forself-driven photodetection under 532 nm light irradiation, includinga responsivity of 249 mA/W, a specific detectivity of 3.6 x 10(11) Jones, an open-circuit voltage of 0.56 V, and a short response/recoverytime of 10.5 & mu;s/7.3 & mu;s. The results introduced here providea path to significantly improve the electrical properties of optoelectronicdevices based on a 2D material heterostructure.
引用
收藏
页码:11327 / 11333
页数:7
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