Unsupervised defect segmentation on denim fabric via local patch prediction and residual fusion

被引:4
作者
Gu, Mengshang [1 ]
Zhou, Jian [1 ]
Pan, Ruru [1 ]
Gao, Weidong [1 ]
机构
[1] Jiangnan Univ, Key Lab Eco Text, Minist Educ, Wuxi, Peoples R China
关键词
Defect detection; anomaly segmentation; deep learning; unsupervised learning; denim fabric;
D O I
10.1177/00405175231153620
中图分类号
TB3 [工程材料学]; TS1 [纺织工业、染整工业];
学科分类号
0805 ; 080502 ; 0821 ;
摘要
Deep learning-based defect inspection has gained popularity in recent years. The dataset requirements for the supervised learning-based method are currently high, but the types of defects are numerous and difficult to gather. This work proposes a local image reconstruction-based unsupervised fabric defect segmentation method to address this problem. Cyclic structures make up the normal portion of the fabric image, whereas the defects are anomalous and minor in comparison. As a result, the defect will be recreated as a normal texture utilizing the information from its surrounding areas, and the defect information will be preserved in the residual image. By masking the same area with various shapes, different reconstruction outcomes and residual images can be achieved. The signal of the defect will be amplified and the noise will be decreased due to the random distribution when the generated residual pictures are fused, which can effectively identify the defect from the noise and lower the false detection rate. On the denim fabric dataset, the proposed unsupervised method can achieve high precision fabric defect segmentation, with the defect detection rate and detection precision reaching at least 85% and 89%, respectively, with high efficiency (approximately 60 m/min inspection speed), outperforming other fabric defect segmentation methods.
引用
收藏
页码:3573 / 3587
页数:15
相关论文
共 30 条
[1]  
Chi Lu, 2020, Adv Neural Inf Process Syst, V33, P4479
[2]   Region filling and object removal by exemplar-based image inpainting [J].
Criminisi, A ;
Pérez, P ;
Toyama, K .
IEEE TRANSACTIONS ON IMAGE PROCESSING, 2004, 13 (09) :1200-1212
[3]  
Geirhos R., 2018, ImageNet-trained CNNs are biased towards texture
[4]  
increasing shape bias improves accuracy and robustness
[5]   Unsupervised defect detection in textiles based on Fourier analysis and wavelet shrinkage [J].
Hu, Guang-Hua ;
Wang, Qing-Hui ;
Zhang, Guo-Hui .
APPLIED OPTICS, 2015, 54 (10) :2963-2980
[6]   Unsupervised fabric defect detection based on a deep convolutional generative adversarial network [J].
Hu, Guanghua ;
Huang, Junfeng ;
Wang, Qinghui ;
Li, Jingrong ;
Xu, Zhijia ;
Huang, Xingbiao .
TEXTILE RESEARCH JOURNAL, 2020, 90 (3-4) :247-270
[7]   Globally and Locally Consistent Image Completion [J].
Iizuka, Satoshi ;
Simo-Serra, Edgar ;
Ishikawa, Hiroshi .
ACM TRANSACTIONS ON GRAPHICS, 2017, 36 (04)
[8]   Image-to-Image Translation with Conditional Adversarial Networks [J].
Isola, Phillip ;
Zhu, Jun-Yan ;
Zhou, Tinghui ;
Efros, Alexei A. .
30TH IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR 2017), 2017, :5967-5976
[9]  
Jing J., 2020, J ENG FIBER FABR, P1
[10]   Automatic fabric defect detection using a deep convolutional neural network [J].
Jing, Jun-Feng ;
Ma, Hao ;
Zhang, Huan-Huan .
COLORATION TECHNOLOGY, 2019, 135 (03) :213-223