The origin of the n-type conductivity for Ta-doped SnO2: Density functional theory study

被引:6
|
作者
Wang, Jiayuan [1 ]
Chang, Jinyan [1 ]
Kang, Sixin [1 ]
Chen, Yu [2 ]
Fan, S. W. [1 ]
机构
[1] China Three Gorges Univ, Hubei Engn Res Ctr Weak Magnet Field Detect, Yichang 443002, Peoples R China
[2] Univ Elect Sci & Technol China, Sch Phys, Chengdu 610054, Peoples R China
来源
MATERIALS TODAY COMMUNICATIONS | 2023年 / 37卷
关键词
Electronic structure; Electron effective mass; Formation energy; Ionization energy; N-type defect; AB-INITIO; THIN-FILMS; TIN-OXIDE; TRANSPARENT; DEFECTS; ENERGIES; MOBILITY;
D O I
10.1016/j.mtcomm.2023.107632
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The electronic structure, intrinsic defects and extrinsic doping of SnO2 are studied by using the hybrid functional method. Research shows that SnO2 is a direct gap semiconductor. Along the Gamma-M (Gamma-Z) direction, the electron effective mass is 0.23 (0.19) m0 (m0: the mass of the free electron). When the Hartree-Fock mixing parameter (alpha) increases to 38%, the calculated band gap for SnO2 is 3.53 eV, which is close to the experimental results. For nonstoichiometric SnO2, both VO and Snint are major n-type defects, and the ionization energies epsilon(0/+) are above the conduction band minimum (CBM). About Ta-doped SnO2, obtained results show Ta substituting Sn (TaSn) is a predominate n-type defect. This work could promote the understanding of the n-type conductivity of SnO2 and provide significant guidance for their applications in transparent electronics.
引用
收藏
页数:6
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