Correlated disorder by defects clusters in LiNbO3 single crystals after crystal ion-slicing

被引:2
|
作者
Dolabella, Simone [1 ,2 ]
Reinhardt, Alexandre [3 ]
Bartasyte, Ausrine [4 ]
Margueron, Samuel [4 ]
Sharma, Amit [5 ]
Maeder, Xavier [5 ]
Dommann, Alex [1 ]
Neels, Antonia [1 ,2 ]
Borzi, Aurelio [1 ,6 ]
机构
[1] Empa, Swiss Fed Labs Mat Sci & Technol, Ctr X Ray Analyt, Uberlandstr 129, CH-8600 Dubendorf, Switzerland
[2] Univ Fribourg, Dept Chem, Chemin Musee 9, CH-1700 Fribourg, Switzerland
[3] Univ Grenoble Alpes, CEA, Leti, F-38000 Grenoble, France
[4] Univ Bourgogne Franche Comte, FEMTO ST Inst, CNRS UMR 6174, ENSMM, 26 Rue Epitaphe, F-25030 Besancon, France
[5] Empa, Swiss Fed Labs Mat Sci & Technol, Mech Mat & Nanostruct, Feuerwerkerstr 39, CH-3602 Thun, Switzerland
[6] Empa, Ctr X Ray Analyt, Uberlandstr 129, CH-8600 Dubendorf, Switzerland
关键词
LiNbO3; Crystal ion-slicing; High-resolution X-ray diffraction; Diffuse X-ray scattering; X-RAY-DIFFRACTION; TRANSMISSION ELECTRON-MICROSCOPY; WAVE-GUIDE LAYERS; LITHIUM-NIOBATE; RADIATION-DAMAGE; IMPLANTED LINBO3; FILMS; FABRICATION; STRAIN; FILTER;
D O I
10.1016/j.matdes.2023.112001
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
LiNbO3 (LNO) is a material suitable for high-frequency and wideband RF filters as well as photonic appli-cations due to its outstanding piezoelectric and optical properties. Applications such as thin-film bulk acoustic wave resonators or highly confined electro-optic modulators require thin films, which are still challenging to be obtained with the necessary crystalline quality by deposition methods. Alternatively to deposition, crystal ion-slicing (CIS) or Smart CutTM enables obtaining thin films hundreds of nanome-ters thick from the bulk single-crystal utilizing high-energy and dose implantation of light atoms. The price to pay is the partial degradation of the initial crystalline perfection, which translates to a degrada-tion of the piezoelectric performance of the material if the CIS-induced damage is not eliminated.This work aims to understand the physics of the recrystallization process of the CIS-damaged LNO crys-tal upon thermal annealing. The study of the coherent and diffuse scattering by high-resolution X-ray diffraction, complemented by micro-Raman backscattering spectroscopy and Transmission Electron Microscopy (TEM), allowed to study the recovery of the crystallinity from the CIS-induced lattice strain and stress and the progressive reduction of the defects clusters dimension.& COPY; 2023 The Author(s). Published by Elsevier Ltd. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/).
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页数:12
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