Micromanipulation and biological, materials science, and medical applications often require controlling or measuring the forces exerted on small objects. Based on the high linearity and sensitivity of OAM beams in the sensing field, this article proposes for the first time to apply OAM beams to force sensing. In this paper, a fiber optic force sensing technology based on the intensity distribution change of orbital angular momentum (OAM) mode is proposed and realized. This technique detects the magnitude of the external force applied to the fiber by exciting the OAM mode with a topological charge 3, thereby tracking changes in light intensity caused by mode coupling. Applying this technique to force measurement, we have experimentally verified that when the sensor is subjected to a force in the range of 0mN to 10mN, the change in speckle light intensity at the sensor output has a good linear relationship with the force. Meanwhile, theoretical analysis and experimental results indicate that compared with previous force sensing methods, this sensing technology has a simple structure, is easy to implement, has good stability, and has practical application potential. & COPY; 2023 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement
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Shenzhen Univ, Coll Inst Microscale Optoelect, Shenzhen 518060, Peoples R ChinaShenzhen Univ, Coll Inst Microscale Optoelect, Shenzhen 518060, Peoples R China
Xie, Zhiqiang
He, Yanliang
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Shenzhen Univ, Coll Inst Microscale Optoelect, Shenzhen 518060, Peoples R ChinaShenzhen Univ, Coll Inst Microscale Optoelect, Shenzhen 518060, Peoples R China
He, Yanliang
Wang, Xinrou
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Shenzhen Univ, Coll Inst Microscale Optoelect, Shenzhen 518060, Peoples R ChinaShenzhen Univ, Coll Inst Microscale Optoelect, Shenzhen 518060, Peoples R China
Wang, Xinrou
Wu, Haisheng
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Shenzhen Univ, Coll Inst Microscale Optoelect, Shenzhen 518060, Peoples R ChinaShenzhen Univ, Coll Inst Microscale Optoelect, Shenzhen 518060, Peoples R China
Wu, Haisheng
Li, Canming
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Shenzhen Univ, Coll Inst Microscale Optoelect, Shenzhen 518060, Peoples R ChinaShenzhen Univ, Coll Inst Microscale Optoelect, Shenzhen 518060, Peoples R China
Li, Canming
Ye, Huapeng
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South China Normal Univ, South China Acad Adv Optoelect, Guangdong Prov Key Lab Opt Informat Mat & Technol, Guangzhou 510006, Peoples R China
South China Normal Univ, Inst Elect Paper Displays, South China Acad Adv Optoelect, Guangzhou 510006, Peoples R ChinaShenzhen Univ, Coll Inst Microscale Optoelect, Shenzhen 518060, Peoples R China
Ye, Huapeng
Liu, Junmin
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Shenzhen Technol Univ, Coll New Mat & New Energies, Shenzhen 518118, Peoples R ChinaShenzhen Univ, Coll Inst Microscale Optoelect, Shenzhen 518060, Peoples R China
Liu, Junmin
Li, Ying
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Shenzhen Univ, Coll Inst Microscale Optoelect, Shenzhen 518060, Peoples R ChinaShenzhen Univ, Coll Inst Microscale Optoelect, Shenzhen 518060, Peoples R China
Li, Ying
Yang, Yatao
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Shenzhen Univ, Coll Elect & Informat Engn, Shenzhen 518060, Peoples R ChinaShenzhen Univ, Coll Inst Microscale Optoelect, Shenzhen 518060, Peoples R China
Yang, Yatao
Fan, Dianyuan
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Shenzhen Univ, Coll Inst Microscale Optoelect, Shenzhen 518060, Peoples R ChinaShenzhen Univ, Coll Inst Microscale Optoelect, Shenzhen 518060, Peoples R China
Fan, Dianyuan
Chen, Shuqing
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Shenzhen Univ, Coll Inst Microscale Optoelect, Shenzhen 518060, Peoples R ChinaShenzhen Univ, Coll Inst Microscale Optoelect, Shenzhen 518060, Peoples R China
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Univ Colorado, Dept Phys, Boulder, CO 80309 USAUniv Colorado, Dept Phys, Boulder, CO 80309 USA
Heffernan, Brendan M.
Niederriter, Robert D.
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Univ Colorado, Dept Phys, Boulder, CO 80309 USAUniv Colorado, Dept Phys, Boulder, CO 80309 USA
Niederriter, Robert D.
Siemens, Mark E.
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Univ Denver, Dept Phys & Astron, 2112 East Wesley Ave, Denver, CO 80308 USAUniv Colorado, Dept Phys, Boulder, CO 80309 USA
Siemens, Mark E.
Gopinath, Juliet T.
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Univ Colorado, Dept Phys, Boulder, CO 80309 USA
Univ Colorado, Dept Elect Comp & Energy Engn, Boulder, CO 80309 USAUniv Colorado, Dept Phys, Boulder, CO 80309 USA