Edge device for ultraviolet fluorescence inspection of photovoltaic panels

被引：0
作者：
Di Renzo, Andre Biffe [1 ]
Ruiz Zamarreno, Carlos [2 ]
Martelli, Cicero [3 ]
Cardozo da Silva, Jean Carlos [3 ]
机构：
[1] Univ Tecnol Fed Parana, Inst Fed Fed Parana, Grad Program Elect & Comp Engn, Curitiba, Parana, Brazil
[2] Univ Publ Navarra, Dept Ingn Elect Elect & Comunicac, Pamplona, Spain
[3] Univ Tecnol Fed Parana, Grad Program Elect & Comp Engn, Curitiba, Parana, Brazil
来源：
2023 IEEE SENSORS | 2023年
关键词：
Artificial intelligence; edge-device; photovoltaic; ultraviolet; FIELD;
D O I：
10.1109/SENSORS56945.2023.10325174
中图分类号：
R318 [生物医学工程];
学科分类号：
0831 ;
摘要：
Regular inspection of photovoltaic panels plays a key role in maximizing performance, ensuring safety, and extending the life of solar plants. This paper presents the construction of a 6W 365 nm ultraviolet light source for ultraviolet fluorescence (UVF) inspections coupled with an edge device used to capture and process the fluorescence images. In addition, an artificial intelligence (AI) algorithm was applied to identify and classify automatically healthy and defective cells in the captured images. The trained AI presents a precision of 89%, and this result shows that the development of an ultraviolet light source coupled with an edge device for automatic cell classification could help with the maintenance staff to make routine UVF inspections to identify possible defects in cell structure, which is the main contribution of the presented work.
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页数：4
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