Effects of feedback reliability on event-related potentials in an arrow flanker task

被引:0
作者
Jia, Meixue [1 ]
Wang, Aili [1 ]
Sui, Li [1 ,2 ]
机构
[1] Univ Shanghai Sci & Technol, Sch Hlth Sci & Engn, Shanghai, Peoples R China
[2] Univ Shanghai Sci & Technol, Sch Hlth Sci & Engn, 516 Jun Gong Rd, Shanghai 200093, Peoples R China
关键词
error-related negativity; feedback-related negativity; feedback reliability; P3; NEGATIVITY FRN; BRAIN ACTIVITY; ERRORS; COMPONENTS;
D O I
10.1097/WNR.0000000000001944
中图分类号
Q189 [神经科学];
学科分类号
071006 ;
摘要
The processing of feedback is essential for learning, error detection, and correction. However, the underlying mechanisms of the feedback's characteristics, such as its reliability, valence, and expectations in the processing of error information, are not completely clear. The two degrees of feedback reliability, reliable feedback and unreliable feedback, respectively, were established by manipulating the feedback valence. The time course of event-related potentials (ERP) during the arrow flanker tasks was used to investigate the effects of feedback reliability and responses on brain activity. Three ERP components, the error-related negativity (ERN), feedback-related negativity (FRN), and P3, respectively, were measured. The impacts of feedback reliability and responses on ERN, FRN, and P3 had a different profile. Specifically, ERN and P3 are associated with the responses but not the feedback reliability, while FRN is associated with feedback reliability and feedback expectations but not the responses. The ERN, FRN, and P3 reflect distinct cognitive processes in the processing of error information.
引用
收藏
页码:693 / 702
页数:10
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