Review-Extremely Thin Amorphous Indium Oxide Transistors

被引:40
作者
Charnas, Adam [1 ,2 ]
Zhang, Zhuocheng [1 ,2 ]
Lin, Zehao [1 ,2 ]
Zheng, Dongqi [1 ,2 ]
Zhang, Jie [1 ,2 ]
Si, Mengwei [1 ,2 ,3 ]
Ye, Peide D. [1 ,2 ]
机构
[1] Purdue Univ, Elmore Family Sch Elect & Comp Engn, W Lafayette, IN 47907 USA
[2] Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USA
[3] Shanghai Jiao Tong Univ, Dept Elect Engn, Shanghai 200240, Peoples R China
关键词
amorphous; atomic layer deposition; back-end-of-line; In2O3; oxide semiconductors; OPTICAL-PROPERTIES; FILM TRANSISTORS; IN2O3; CRYSTAL; GROWTH; PERFORMANCE; DEPOSITION;
D O I
10.1002/adma.202304044
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Amorphous oxide semiconductor transistors have been a mature technology in display panels for upward of a decade, and have recently been considered as promising back-end-of-line compatible channel materials for monolithic 3D applications. However, achieving high-mobility amorphous semiconductor materials with comparable performance to traditional crystalline semiconductors has been a long-standing problem. Recently it has been found that greatly reducing the thickness of indium oxide, enabled by an atomic layer deposition (ALD) process, can tune its material properties to achieve high mobility, high drive current, high on/off ratio, and enhancement-mode operation at the same time, beyond the capabilities of conventional oxide semiconductor materials. In this work, the history leading to the re-emergence of indium oxide, its fundamental material properties, growth techniques with a focus on ALD, state-of-the-art indium oxide device research, and the bias stability of the devices are reviewed.
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页数:18
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