Label Correlation in Deep Learning-Based Side-Channel Analysis

被引:6
作者
Wu, Lichao [1 ]
Weissbart, Leo [1 ,2 ]
Krcek, Marina [1 ]
Li, Huimin [1 ]
Perin, Guilherme [1 ,2 ]
Batina, Lejla [2 ]
Picek, Stjepan [1 ,2 ]
机构
[1] Delft Univ Technol, Fac Elect Engn Math & Comp Sci, NL-2628 XE Delft, Netherlands
[2] Radboud Univ Nijmegen, Digital Secur Grp, NL-6525 EC Nijmegen, Netherlands
关键词
Side-channel analysis; profiling analysis; deep learning; label distribution; profiling model fitting;
D O I
10.1109/TIFS.2023.3287728
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
The efficiency of the profiling side-channel analysis can be significantly improved with machine learning techniques. Although powerful, a fundamental machine learning limitation of being data-hungry received little attention in the side-channel community. In practice, the maximum number of leakage traces that evaluators/attackers can obtain is constrained by the scheme requirements or the limited accessibility of the target. Even worse, various countermeasures in modern devices increase the conditions on the profiling size to break the target. This work demonstrates a practical approach to dealing with the lack of profiling traces. Instead of learning from a one-hot encoded label, transferring the labels to their distribution can significantly speed up the convergence of guessing entropy. By studying the relationship between all possible key candidates, we propose a new metric, denoted Label Correlation (LC), to evaluate the generalization ability of the profiling model. We validate LC with two common use cases: early stopping and network architecture search, and the results indicate its superior performance.
引用
收藏
页码:3849 / 3861
页数:13
相关论文
共 50 条
[41]   Enhancing deep learning-based side-channel analysis using feature engineering in a fully simulated IoT system [J].
Alabdulwahab, Saleh ;
Cheong, Muyoung ;
Seo, Aria ;
Kim, Young-Tak ;
Son, Yunsik .
EXPERT SYSTEMS WITH APPLICATIONS, 2025, 266
[42]   One for All, All for Ascon: Ensemble-Based Deep Learning Side-Channel Analysis [J].
Rezaeezade, Azade ;
Basurto-Becerra, Abraham ;
Weissbart, Leo ;
Perin, Guilherme .
APPLIED CRYPTOGRAPHY AND NETWORK SECURITY WORKSHOPS, PT I, ACNS 2024-AIBLOCK 2024, AIHWS 2024, AIOTS 2024, SCI 2024, AAC 2024, SIMLA 2024, LLE 2024, AND CIMSS 2024, 2024, 14586 :139-157
[43]   A Guessing Entropy-Based Framework for Deep Learning-Assisted Side-Channel Analysis [J].
Zhang, Ziyue ;
Ding, A. Adam ;
Fei, Yunsi .
IEEE TRANSACTIONS ON INFORMATION FORENSICS AND SECURITY, 2023, 18 :3018-3030
[44]   Deep-Learning-Based Side-Channel Analysis of Block Cipher PIPO With Bitslice Implementation [J].
Woo, Ji-Eun ;
Han, Jaeseung ;
Han, Dong-Guk .
IEEE ACCESS, 2022, 10 :69303-69311
[45]   Everything All at Once: Deep Learning Side-Channel Analysis Optimization Framework [J].
Serafini, Gabriele ;
Weissbart, Leo ;
Batina, Lejla .
APPLIED CRYPTOGRAPHY AND NETWORK SECURITY WORKSHOPS, PT I, ACNS 2024-AIBLOCK 2024, AIHWS 2024, AIOTS 2024, SCI 2024, AAC 2024, SIMLA 2024, LLE 2024, AND CIMSS 2024, 2024, 14586 :195-212
[46]   A Comparison of Deep Learning Approaches for Power-Based Side-Channel Attacks [J].
Capoferri, Roberto ;
Barenghi, Alessandro ;
Breveglieri, Luca ;
Izzo, Niccolo ;
Pelosi, Gerardo .
SECURE IT SYSTEMS, NORDSEC 2024, 2025, 15396 :101-120
[47]   CA-SCA: Non-Profiled Deep Learning-Based Side-Channel Attacks by Using Cluster Analysis [J].
Fukuda, Yuta ;
Yoshida, Kota ;
Fujino, Takeshi .
IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, 2025, E108A (03) :227-241
[48]   Machine Learning-Based Classification of Hardware Trojans Using Power Side-Channel Signals [J].
Bhatta, Niraj Prasad ;
Giri, Usha ;
Amsaad, Fathi .
2024 IEEE 67TH INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, MWSCAS 2024, 2024, :990-994
[49]   Strength in numbers: Improving generalization with ensembles in machine learning-based profiled side-channel analysis [J].
Perin G. ;
Chmielewski Ł. ;
Picek S. .
IACR Transactions on Cryptographic Hardware and Embedded Systems, 2020, 2020 (04) :337-364
[50]   DEEP LEARNING FOR MINIMAL-CONTEXT BLOCK TRACKING THROUGH SIDE-CHANNEL ANALYSIS [J].
Jensen, L. ;
Brown, G. ;
Wang, X. ;
Harer, J. ;
Chin, S. .
2019 IEEE INTERNATIONAL CONFERENCE ON ACOUSTICS, SPEECH AND SIGNAL PROCESSING (ICASSP), 2019, :3207-3211