Controlling the heat, flow, and oxygen transport by double-partitions during continuous Czochralski (CCz) silicon crystal growth

被引:10
作者
Nguyen, Thi-Hoai-Thu [1 ,2 ]
Chen, Jyh-Chen [1 ]
Li, Chun-Hsien [1 ]
机构
[1] Natl Cent Univ, Taoyuan City, Taiwan
[2] Nong Lam Univ, Ho Chi Minh City, Vietnam
关键词
Continuous Czochralski; Oxygen transport; Silicon single crystal; Convection; Diffusion; INTERFACE SHAPE; MELT; SIMULATION;
D O I
10.1016/j.mssp.2022.107235
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The effect of the depths of two partitions on the heat, flow, and oxygen transport during the CCz growth of an 8 -inch diameter silicon crystal is numerically investigated. A crucible in which two partitions are immersed in the silicon melt is so-called a triple-crucible. The different depths of two partitions change the effective wall surface area, which is the main source of oxygen at the growth interface, melt motion, and heat transfer within the crucible. The diffusion and convection of oxygen from the partitions and crucible wall towards the free surface and the crystal-melt (c-m) interface are also affected. The amount of oxygen that dissolves from the effective wall surface into the melt is proportional to the surface temperature and the surface area. The choice of at least one long partition will prevent the entry of unmelted granular silicon into the melt region under the c-m interface. Comparison of various cases shows that when the partition near the c-m interface is longer (90 mm) and the partition near the crucible sidewall is shorter (40 mm), the power consumption and the content of oxygen along the growth interface are lower.
引用
收藏
页数:8
相关论文
共 29 条
  • [1] [Anonymous], 2020, CGSIM FLOW MOD THEOR, V21
  • [2] NUMERICAL AND EXPERIMENTAL-STUDY OF A SOLID PELLET FEED CONTINUOUS CZOCHRALSKI GROWTH-PROCESS FOR SILICON SINGLE-CRYSTALS
    ANSELMO, A
    PRASAD, V
    KOZIOL, J
    GUPTA, KP
    [J]. JOURNAL OF CRYSTAL GROWTH, 1993, 131 (1-2) : 247 - 264
  • [3] Full-scale experiments on solid-pellets feed continuous Czochralski growth of silicon crystals
    Anselmo, A
    Koziol, J
    Prasad, V
    [J]. JOURNAL OF CRYSTAL GROWTH, 1996, 163 (04) : 359 - 368
  • [4] Bender D.L., 2012, Patent, Patent No. [US8262797B1, 8262797]
  • [5] Bender D.L., 2013, Patent No. [US2013/0133567A1, 20130133567]
  • [6] Numerical simulation of the oxygen concentration distribution in silicon melt for different crystal lengths during Czochralski growth with a transverse magnetic field
    Chen, Jyh-Chen
    Chiang, Pei-Yi
    Thi Hoai Thu Nguyen
    Hu, Chieh
    Chen, Chun-Hung
    Liu, Chien-Cheng
    [J]. JOURNAL OF CRYSTAL GROWTH, 2016, 452 : 6 - 11
  • [7] DeLuca J.P, 2012, US2012, Patent No. [2012/0056135A1, 20120056135]
  • [8] A simplified model to predict resistivity profiles in continuous-feeding Cz-silicon crystals
    Giannattasio, Armando
    [J]. JOURNAL OF CRYSTAL GROWTH, 2020, 542
  • [9] Cavities owing to hydrogen in Si single crystals grown by continuously charging CZ method
    Iino, E
    Takano, K
    Kimura, M
    Yamagisi, H
    [J]. MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1996, 36 (1-3): : 146 - 149
  • [10] ROLE OF CRUCIBLE PARTITION IN IMPROVING CZOCHRALSKI MELT CONDITIONS
    JAFRI, IH
    PRASAD, V
    ANSELMO, AP
    GUPTA, KP
    [J]. JOURNAL OF CRYSTAL GROWTH, 1995, 154 (3-4) : 280 - 292