High-resolution and analytical electron microscopy in a liquid flow cell via gas purging

被引：2

作者：

Pivak, Yevheniy ^{[1
]}

Park, Junbeom ^{[2
]}

Basak, Shibabrata ^{[2
,3
,4
]}

Eichel, Ruediger-Albert ^{[2
]}

Beker, Anne ^{[1
]}

Rozene, Alejandro ^{[1
]}

Perez Garza, Hector Hugo ^{[1
]}

Sun, Hongyu ^{[1
]}

机构：

[1] DENSsolut BV, Informaticalaan 12, NL-2628 ZD Delft, Netherlands

[2] Forschungszentrum Julich, Inst Energy & Climate Res, Fundamental Electrochem IEK 9, D-52425 Julich, Germany

[3] Forschungszentrum Julich, Ernst Ruska Ctr Microscopy & Spect Electrons, D-52425 Julich, Germany

[4] Forschungszentrum Julich, Peter Grunberg Inst, D-52425 Julich, Germany

来源：

MICROSCOPY | 2023年 / 72卷 / 06期

关键词：

liquid-phase transmission electron microscopy; liquid cell; liquid thickness; liquid purging; high-resolution electron microscopy; analytical electron microscopy;

D O I：

10.1093/jmicro/dfad023

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Liquid-phase transmission electron microscopy (LPTEM) technique has been used to perform a wide range of in situ and operando studies. While most studies are based on the sample contrast change in the liquid, acquiring high qualitative results in the native liquid environment still poses a challenge. Herein, we present a novel and facile method to perform high-resolution and analytical electron microscopy studies in a liquid flow cell. This technique is based on removing the liquid from the observation area by a flow of gas. It is expected that the proposed approach can find broad applications in LPTEM studies.

引用

页码：520 / 524

页数：5

共 50 条

[41] High-resolution electron microscopy of interfaces between solids with varying degree of atomic ordering
Borgardt, NI
Plikat, B
Seibt, M
INTERFACE SCIENCE, 2004, 12 (2-3) : 311 - 319
[42] High-resolution electron microscopy of stacking faults in heteroepitaxial ZnO/LiTaO3
Lim, SH
Shindo, D
JOURNAL OF ELECTRON MICROSCOPY, 2002, 51 : S165 - S169
[43] Structure of highly dispersed metals and oxides:: exploring the capabilities of high-resolution electron microscopy
Bernal, S
Baker, RT
Burrows, A
Calvino, JJ
Kiely, CJ
López-Cartes, C
Pérez-Omil, JA
Rodríguez-Izquierdo, JM
SURFACE AND INTERFACE ANALYSIS, 2000, 29 (07) : 411 - 421
[44] Energy-filtered high-resolution electron microscopy and composition-sensitive imaging
Wang, ZL
MICROSCOPY RESEARCH AND TECHNIQUE, 1996, 33 (03) : 279 - 287
[45] High-resolution electron microscopy studies on Si3N4 ceramics
Kleebe, H.-J.
Key Engineering Materials, 1994, 89-91 : 339 - 344
[46] High-resolution analytical TEM of nanostructured materials
Schneider, R
ANALYTICAL AND BIOANALYTICAL CHEMISTRY, 2002, 374 (04) : 639 - 645
[47] High-voltage high-resolution electron microscopy study of alkaline-earth copper oxides
Hiroi, Z
Horiuchi, S
MICROSCOPY RESEARCH AND TECHNIQUE, 1998, 40 (04) : 251 - 264
[48] High-resolution STEM observation of the dynamics of Pt nanoparticles in a liquid
Takeguchi, Masaki
Li, Xiaoguang
Mitsuishi, Kazutaka
JAPANESE JOURNAL OF APPLIED PHYSICS, 2022, 61 (SD)
[49] The structure of grain boundaries in granite-origin ultramylonite studied by high-resolution electron microscopy
T. Hiraga
T. Nagase
M. Akizuki
Physics and Chemistry of Minerals, 1999, 26 : 617 - 623
[50] High-resolution electron microscopy characterization of nanocrystalline grain boundaries in gold-copper alloys
Nyakiti, L. O.
Chaudhuri, J.
Jankowski, A. F.
THIN SOLID FILMS, 2008, 517 (03) : 1182 - 1185

← 1 2 3 4 5 →