Effects of High-Density Current on the Reliability of Ni-Sn Solid-Liquid Interdiffusion Joints with Al Interlayer

被引:0
作者
Satoh, Toshikazu [1 ]
Wakasugi, Makoto [1 ]
Usui, Masanori [1 ]
机构
[1] Toyota Cent Res & Dev Labs Inc, 41-1 Yokomichi, Nagakute, Aichi 4801192, Japan
关键词
High-density current; Ni-Sn solid-liquid interdiffusion; Al interlayer; electromigration; thermal migration; ELECTROMIGRATION; CU; TIN; AG;
D O I
10.1007/s11664-022-10059-1
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Electric vehicles are becoming increasingly popular as environmentally friendly alternatives to conventional fossil fuel-based vehicles. The need to improve their performance demands design of materials that can withstand high current density without adversely affecting their durability. In this study, the influence of high-density current on the structure of a Ni-Sn solid-liquid interdiffusion joint with an Al interlayer was examined. The temperature at the joint region increased to 240 degrees C without external heating under energization of 20 kA/cm(2). After 100 h of energization, several structural evolutions from the initial state were observed in the joint region, including precipitation of Al3Ni at the cathode-side Al/Ni interface and enrichment of Ni concentration on both sides of the Ni-Sn intermetallic compound (IMC) layer. Electromigration influenced the precipitation position of the Al3Ni grains. However, there was only a trace of electromigration in the Ni enrichment behavior of the Ni-Sn IMC layer, because thermal and stress migration were very active there. The degree of Ni enrichment in the energized Ni-Sn IMC layer was much higher than that in the Ni-Sn IMC layer annealed at 300 degrees C for 100 h. This result implies that a high-density current activates the thermal migration and stress migration. The influence on the reliability of the joint is a concern because the high degree of Ni enrichment in the energized Ni-Sn IMC layer generates many Kirkendall voids.
引用
收藏
页码:1132 / 1144
页数:13
相关论文
共 32 条
  • [11] The nanoindentation characteristics of Cu6Sn5, Cu3Sn, and Ni3Sn4 intermetallic compounds in the solder bump
    Jang, GY
    Lee, JW
    Duh, JG
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2004, 33 (10) : 1103 - 1110
  • [12] Effect of Sn crystallographic orientation on solder electromigration and Ni diffusion in Cu/Ni plating/Sn-0.7Cu joint at low current density
    Kadoguchi, Takuya
    Sakai, Tsubasa
    Sei, Tsubasa
    Take, Naoya
    Yamanaka, Kimihiro
    Nagao, Shijo
    Suganuma, Katsuaki
    [J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2017, 28 (17) : 12630 - 12639
  • [13] Silver nanoporous sheet for solid-state die attach in power device packaging
    Kim, Min-Su
    Nishikawaa, Hiroshi
    [J]. SCRIPTA MATERIALIA, 2014, 92 : 43 - 46
  • [14] Material science and device physics in SiC technology for high-voltage power devices
    Kimoto, Tsunenobu
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 2015, 54 (04)
  • [15] Thermal Stress Assessment for Transient Liquid-Phase Bonded Si Chips in High-Power Modules Using Experimental and Numerical Methods
    Lis, Adrian
    Kicin, Slavo
    Brem, Franziska
    Leinenbach, Christian
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2017, 46 (02) : 729 - 741
  • [16] Effect of Process and Service Conditions on TLP-Bonded Components with (Ag,Ni-)Sn Interlayer Combinations
    Lis, Adrian
    Leinenbach, Christian
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2015, 44 (11) : 4576 - 4588
  • [17] Effect of Zn doping on SnAg solder microstructure and electromigration stability
    Lu, Minhua
    Shih, Da-Yuan
    Kang, Sung K.
    Goldsmith, Charles
    Flaitz, Philip
    [J]. JOURNAL OF APPLIED PHYSICS, 2009, 106 (05)
  • [18] Review on Driving Circuits for Wide-Bandgap Semiconductor Switching Devices for Mid- to High-Power Applications
    Ma, Chao-Tsung
    Gu, Zhen-Huang
    [J]. MICROMACHINES, 2021, 12 (01) : 1 - 28
  • [19] Effects of Co additions on electromigration behaviors in Sn-3.0 Ag-0.5 Cu-based solder joint
    Ma, Limin
    Xu, Guangchen
    Sun, Jia
    Guo, Fu
    Wang, Xitao
    [J]. JOURNAL OF MATERIALS SCIENCE, 2011, 46 (14) : 4896 - 4905
  • [20] Nash P., 1985, Bull. Alloy Phase Diagrams, V6, P350, DOI DOI 10.1007/BF02880521