Enhanced Performance of Organic Field-Effect Transistor with Bi-Functional N-Type Organic Semiconductor Layer

被引:2
|
作者
Yu, Tianpeng [1 ,2 ]
Hou, Shuyi [1 ,2 ]
Liu, Zhenliang [1 ,2 ]
Wang, Yiru [3 ,4 ]
Yin, Jiang [1 ,2 ,3 ,4 ]
Gao, Xu [5 ]
Liu, Nannan [6 ]
Yuan, Guoliang [6 ]
Wu, Lei [7 ]
Xia, Yidong [1 ,2 ]
Liu, Zhiguo [1 ,2 ]
机构
[1] Nanjing Univ, Coll Engn & Appl Sci, Jiangsu Key Lab Artificial Funct Mat, Nanjing 210093, Peoples R China
[2] Nanjing Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Peoples R China
[3] Nanjing Univ Posts & Telecommun, State Key Lab Organ Elect & Informat Displays, Nanjing 210023, Peoples R China
[4] Nanjing Univ Posts & Telecommun, Informat Displays & Inst Adv Mat, Nanjing 210023, Peoples R China
[5] Soochow Univ, Inst Funct Nano & Soft Mat FUNSOM, Jiangsu Key Lab Carbon Based Funct Mat & Devices, Suzhou 215123, Jiangsu, Peoples R China
[6] Nanjing Univ Sci & Technol, Sch Mat Sci & Engn, Nanjing 210094, Peoples R China
[7] Nanjing Vocat Univ Ind Technol, Coll Elect Engn, Nanjing 210023, Peoples R China
基金
中国国家自然科学基金;
关键词
bi-functional; endurance characteristic; hole-trapping; organic field-effect transistor; pentacene; THIN-FILM TRANSISTORS; MEMORY; ELECTRETS;
D O I
10.1002/aelm.202300651
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Organic field-effect transistors (OFETs) hold great promise for applications in non-volatile memories, detectors, and artificial synapses due to the good flexibility and biocompatibility. However, certain drawbacks such as high operating voltages and significant degradation in endurance characteristics have hindered their practical implementations. Herein, a novel approach is proposed to enhance the performance of OFETs by incorporating a bi-functional n-type polymer semiconductor interlayer, Poly-{[N,N'-bis(2-octyldodecyl)naphthalene-1,4,5,8-bis(dicarboximide)-2,6-diyl]-alt-5,5 '-(2,2 '-bithiophene)} (N2200), into a pentacene OFET structure. The device exhibits remarkable improvements, with reliable P/E operation cycles of over than 104 and a retention time of more than 10 years. On one hand, the inclusion of N2200 as an n-type semiconductor effectively reduces the height of hole-injection barrier for trapping and thus reducing the working voltage based on the electrostatic induction theory. On the other hand, n-type semiconductor N2200 serves as a native hole-consumption (or hole-trapping) dielectric, and its narrower bandgap restrains the formation of deep hole-traps, thus favoring the endurance characteristics of the OFET. A novel approach is proposed to enhance the performance of pentacene OFET memory device by incorporating a bi-functional n-type polymer semiconductor interlayer (N2200). The device exhibits a memory window of larger than 13.7 V at P/E voltages (+/- 20 V), reliable P/E operation cycles of over than 104 and a retention time of more than 10 years.image
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页数:8
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