Phonon-assisted optical absorption of SiC polytypes from first principles

被引:11
作者
Zhang, Xiao [1 ]
Kioupakis, Emmanouil [1 ]
机构
[1] Univ Michigan, Dept Mat Sci & Engn, Ann Arbor, MI 48109 USA
关键词
QUASI-PARTICLE; ELECTRONIC-STRUCTURE; RAMAN-SCATTERING; 6H; 1ST-PRINCIPLES; FILMS; OPTOELECTRONICS; DISPERSION; DIODES; GROWTH;
D O I
10.1103/PhysRevB.107.115207
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Silicon carbide (SiC) is an indirect-gap semiconductor material widely used in electronic and optoelectronic applications. While experimental measurements of the phonon-assisted absorption coefficient of SiC across its indirect gap have existed for more than 50 years, theoretical investigations of phonon-assisted absorption have been hampered by their excessive computational cost. In this work, we calculate the phonon-assisted temperature-dependent optical absorption spectra of the commonly occurring SiC polytypes (3C, 2H, 4H, 6H, and 15R), using first-principles approaches based on density functional theory and related techniques. We show that our results agree with experimentally determined absorption coefficients in the spectral region between the direct and indirect band gaps. The temperature dependence of the spectra can be well predicted with taking the temperature dependence of the band gaps into account. Lastly, we compare the spectra obtained with second-order perturbation theory to those determined by the special displacement method and we show that the full consideration of the electronic energy renormalization due to temperature is important to further improve the prediction of the phonon-assisted absorption in SiC. Our insights can be applied to predict the optical spectra of the less common SiC polytypes and other indirect-gap semiconductors in general.
引用
收藏
页数:12
相关论文
共 81 条
  • [1] DETERMINATION OF OPTICAL PARAMETERS OF FILMS OF PVA/TiO2/SiC AND PVA/MgO/SiC NANOCOMPOSITES FOR OPTOELECTRONICS AND UV-DETECTORS
    Ahmed, H.
    Hashim, A.
    Abduljalil, H. M.
    [J]. UKRAINIAN JOURNAL OF PHYSICS, 2020, 65 (06): : 533 - 541
  • [2] Ultraprecision CMP for sapphire, GaN, and SiC for advanced optoelectronics materials
    Aida, Hideo
    Doi, Toshiro
    Takeda, Hidetoshi
    Katakura, Haruji
    Kim, Seong-Woo
    Koyama, Koji
    Yamazaki, Tsutomu
    Uneda, Michio
    [J]. CURRENT APPLIED PHYSICS, 2012, 12 : S41 - S46
  • [3] Crystal structures and the electronic properties of silicon-rich silicon carbide materials by first principle calculations
    Alkhaldi, Noura D.
    Barman, Sajib K.
    Huda, Muhammad N.
    [J]. HELIYON, 2019, 5 (11)
  • [4] Bai S., 2002, MATER RES SOC SYMP P, V742, P31
  • [5] Phonons and related crystal properties from density-functional perturbation theory
    Baroni, S
    de Gironcoli, S
    Dal Corso, A
    Giannozzi, P
    [J]. REVIEWS OF MODERN PHYSICS, 2001, 73 (02) : 515 - 562
  • [6] Synthesis and characterization of WS2/graphene/SiC van der Waals heterostructures via WO3-x thin film sulfurization
    Bradford, Jonathan
    Shafiei, Mahnaz
    MacLeod, Jennifer
    Motta, Nunzio
    [J]. SCIENTIFIC REPORTS, 2020, 10 (01)
  • [7] SiC flame sensors for gas turbine control systems
    Brown, DM
    Downey, E
    Kretchmer, J
    Michon, G
    Shu, E
    Schneider, D
    [J]. SOLID-STATE ELECTRONICS, 1998, 42 (05) : 755 - 760
  • [8] Electronic structure and the local electroneutrality level of SiC polytypes from quasiparticle calculations within the GW approximation
    Brudnyi, V. N.
    Kosobutsky, A. V.
    [J]. JOURNAL OF EXPERIMENTAL AND THEORETICAL PHYSICS, 2012, 114 (06) : 1037 - 1042
  • [9] TERRACE GROWTH AND POLYTYPE DEVELOPMENT IN EPITAXIAL BETA-SIC FILMS ON ALPHA-SIC (6H AND 15R) SUBSTRATES
    CHIEN, FR
    NUTT, SR
    YOO, WS
    KIMOTO, T
    MATSUNAMI, H
    [J]. JOURNAL OF MATERIALS RESEARCH, 1994, 9 (04) : 940 - 954
  • [10] The electronic structure and spectroscopic properties of 3C, 2H, 4H, 6H, 15R and 21R polymorphs of SiC
    Ching, W. Y.
    Xu, Yong-Nian
    Rulis, Paul
    Ouyang, Lizhi
    [J]. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2006, 422 (1-2): : 147 - 156