共 16 条
[1]
[Anonymous], SILV 45NM OP CELL LI
[2]
Appello D., 2017, IEEE DESIGN AUTOMATI
[4]
Effective SAT-based Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity in a Pipelined Processor
[J].
2021 IEEE 30TH ASIAN TEST SYMPOSIUM (ATS 2021),
2021,
:73-78
[5]
Maximizing the Switching Activity of Different Modules Within a Processor Core via Evolutionary Techniques
[J].
2021 24TH EUROMICRO CONFERENCE ON DIGITAL SYSTEM DESIGN (DSD 2021),
2021,
:535-540
[6]
Faller T., 2021, LATIN AM TEST S
[7]
Gurumurthy S, 2007, PROC EUR TEST SYMP, P173
[8]
Advanced Burn-In - An Optimized Product Stress and Test Flow for Automotive Microcontrollers
[J].
2019 IEEE INTERNATIONAL TEST CONFERENCE (ITC),
2019,
[9]
Wafer Level Stress: Enabling Zero Defect Quality for Automotive Microcontrollers without Package Burn-In
[J].
2020 IEEE INTERNATIONAL TEST CONFERENCE (ITC),
2020,
[10]
Infant mortality TBThe lesser known reliability issue
[J].
13TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM PROCEEDINGS,
2007,
:122-122