Statistics of electron-multiplying charge-coupled devices

被引:1
|
作者
Sutin, Brian M. [1 ]
机构
[1] CALTECH, Jet Prop Lab, Pasadena, CA 91125 USA
基金
美国国家航空航天局;
关键词
electron multiplying charge-coupled devices; photon counting; data analysis and techniques; clock-induced charge; ultraviolet instrumentation; read noise;
D O I
10.1117/1.JATIS.9.2.028001
中图分类号
V [航空、航天];
学科分类号
08 ; 0825 ;
摘要
Electron-multiplying charge-coupled devices are efficient imaging devices for lowsurface-brightness ultraviolet astronomy from space. The large amplification allows photon counting (PC), the detection of events versus nonevents. This paper provides the statistics of the observation process, the photon-counting process, the amplification process, and the compression. The expression for the signal-to-noise of PC is written in terms of the polygamma function. The optimal exposure time is a function of the clock-induced charge. The exact distribution of amplification process is a simple- to-compute powered matrix. The optimal cutoff for comparing to the read noise is close to a strong function of the read noise and a weak function of the electron-multiplying gain and photon rate. A formula gives the expected compression rate. (c) The Authors.
引用
收藏
页数:13
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