Module Reliability in Winter: Field analysis of deflection and cell cracking across multiple module architectures

被引:0
|
作者
Burnham, Laurie [1 ]
Riley, Daniel [1 ]
King, Bruce [1 ]
Snyder, William [1 ]
Santistevan, Kevin [1 ]
Dice, Paul W. [2 ]
机构
[1] Sandia Natl Labs, Albuquerque, NM 87185 USA
[2] Michigan Technol Univ, Houghton, MI 49931 USA
来源
2023 IEEE 50TH PHOTOVOLTAIC SPECIALISTS CONFERENCE, PVSC | 2023年
关键词
D O I
10.1109/PVSC48320.2023.10359901
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Snow, which affects vast areas of the northern hemisphere, can be problematic for photovoltaic (PV) systems for three reasons; one, the shading of solar cells by snow stifles power generation[1]; two, the broad geographic sweep of most snowstorms challenges the availability of solar to meet regional energy needs; and three, the weight of snow, combined with wind and cold loading, can physically damage modules and cells. Not only are load stressors in winter poorly understood but almost nothing is known about the robustness of different module technologies exposed to those stressors. This paper will present data from a field study of multiple module types, including half-cut cells, bifacial and large-form factor architectures, installed at the Michigan Regional Test Center in Calumet, Michigan. Modules were installed on single-module racks instrumented with load cells, deflection sensors, and anemometers. Each module was subjected to electro-luminescent imaging at the beginning and end of winter to document the presence or absence of cell damage; in addition, time-series data were collected to quantify snow, wind and temperature loads and images collected to compare rates of snow-shedding across module technologies.
引用
收藏
页数:3
相关论文
共 50 条
  • [1] Allocation and analysis of reliability: multiple levels: system, subsystem, and module
    Schneidewind, Norman
    INNOVATIONS IN SYSTEMS AND SOFTWARE ENGINEERING, 2006, 2 (3-4) : 121 - 136
  • [2] THE EFFECT OF CELL THICKNESS ON MODULE RELIABILITY
    Wohlgemuth, John H.
    Cunningham, Daniel W.
    Placer, Neil V.
    Kelly, George J.
    Nguyen, Andy M.
    PVSC: 2008 33RD IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE, VOLS 1-4, 2008, : 1697 - 1700
  • [3] Reliability modeling analysis of a power module
    Liu, Yan
    Xu, Yangjian
    Liu, Yong
    2013 14TH INTERNATIONAL CONFERENCE ON THERMAL, MECHANICAL AND MULTI-PHYSICS SIMULATION AND EXPERIMENTS IN MICROELECTRONICS AND MICROSYSTEMS (EUROSIME), 2013,
  • [4] Consensus module analysis of abdominal fat deposition across multiple broiler lines
    Hui Yuan
    Jun Lu
    BMC Genomics, 22
  • [5] Consensus module analysis of abdominal fat deposition across multiple broiler lines
    Yuan, Hui
    Lu, Jun
    BMC GENOMICS, 2021, 22 (01)
  • [6] Photovoltaic module reliability model based on field degradation studies
    Vazquez, Manuel
    Rey-Stolle, Ignacio
    PROGRESS IN PHOTOVOLTAICS, 2008, 16 (05): : 419 - 433
  • [7] A Review of Degradation and Reliability Analysis of a Solar PV Module
    Khan, Zafar Ullah
    Khan, Adnan Daud
    Khan, Khalid
    Al Khatib, Soliman Abdul Karim
    Khan, Shahbaz
    Khan, Muhammad Qasim
    Ullah, Abid
    IEEE ACCESS, 2024, 12 : 185036 - 185056
  • [8] Cell-to-Module Simulation Analysis for Optimizing the Efficiency and Power of the Photovoltaic Module
    Yousuf, Hasnain
    Zahid, Muhammad Aleem
    Khokhar, Muhammad Quddamah
    Park, Jinjoo
    Ju, Minkyu
    Lim, Donggun
    Kim, Youngkuk
    Cho, Eun-Chel
    Yi, Junsin
    ENERGIES, 2022, 15 (03)
  • [9] Comparing conceptual understanding across institutions with module analysis
    Wheatley, Christopher
    Wells, James
    Pritchard, David E.
    Stewart, John
    PHYSICAL REVIEW PHYSICS EDUCATION RESEARCH, 2022, 18 (02):
  • [10] Numerical Analysis on Temperature Field in a LED Module
    Du, Dongxing
    Li, Yingge
    Luo, Xiaobing
    ADVANCED POLYMER SCIENCE AND ENGINEERING, 2011, 221 : 604 - +