YOLO-MBBi: PCB Surface Defect Detection Method Based on Enhanced YOLOv5

被引:44
作者
Du, Bowei [1 ]
Wan, Fang [1 ]
Lei, Guangbo [1 ]
Xu, Li [1 ]
Xu, Chengzhi [1 ]
Xiong, Ying [1 ]
机构
[1] Hubei Univ Technol, Sch Comp Sci, Wuhan 430068, Peoples R China
关键词
printed circuit board (PCB); defect detection; deep learning; YOLOv5; NETWORK;
D O I
10.3390/electronics12132821
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Printed circuit boards (PCBs) are extensively used to assemble electronic equipment. Currently, PCBs are an integral part of almost all electronic products. However, various surface defects can still occur during mass production. An enhanced YOLOv5s network named YOLO-MBBi is proposed to detect surface defects on PCBs to address the shortcomings of the existing PCB surface defect detection methods, such as their low accuracy and poor real-time performance. YOLO-MBBi uses MBConv (mobile inverted residual bottleneck block) modules, CBAM attention, BiFPN, and depth-wise convolutions to substitute layers in the YOLOv5s network and replace the CIoU loss function with the SIoU loss function during training. Two publicly available datasets were selected for this experiment. The experimental results showed that the mAP50 and recall values of YOLO-MBBi were 95.3% and 94.6%, which were 3.6% and 2.6% higher than those of YOLOv5s, respectively, and the FLOPs were 12.8, which was much smaller than YOLOv7's 103.2. The FPS value reached 48.9. Additionally, after using another dataset, the YOLO-MBBi metrics also achieved satisfactory accuracy and met the needs of industrial production.
引用
收藏
页数:24
相关论文
共 32 条
[1]   A Review and Analysis of Automatic Optical Inspection and Quality Monitoring Methods in Electronics Industry [J].
Abu Ebayyeh, Abd Al Rahman M. ;
Mousavi, Alireza .
IEEE ACCESS, 2020, 8 :183192-183271
[2]  
Bochkovskiy A, 2020, Arxiv, DOI arXiv:2004.10934
[3]   TDD-net: a tiny defect detection network for printed circuit boards [J].
Ding, Runwei ;
Dai, Linhui ;
Li, Guangpeng ;
Liu, Hong .
CAAI TRANSACTIONS ON INTELLIGENCE TECHNOLOGY, 2019, 4 (02) :110-116
[4]   Sigmoid-weighted linear units for neural network function approximation in reinforcement learning [J].
Elfwing, Stefan ;
Uchibe, Eiji ;
Doya, Kenji .
NEURAL NETWORKS, 2018, 107 :3-11
[5]  
Howard AG, 2017, Arxiv, DOI arXiv:1704.04861
[6]   An efficient similarity measure approach for PCB surface defect detection [J].
Gaidhane, Vilas H. ;
Hote, Yogesh V. ;
Singh, Vijander .
PATTERN ANALYSIS AND APPLICATIONS, 2018, 21 (01) :277-289
[7]  
Gevorgyan Z, 2022, Arxiv, DOI arXiv:2205.12740
[8]   Rich feature hierarchies for accurate object detection and semantic segmentation [J].
Girshick, Ross ;
Donahue, Jeff ;
Darrell, Trevor ;
Malik, Jitendra .
2014 IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR), 2014, :580-587
[9]   MSFT-YOLO: Improved YOLOv5 Based on Transformer for Detecting Defects of Steel Surface [J].
Guo, Zexuan ;
Wang, Chensheng ;
Yang, Guang ;
Huang, Zeyuan ;
Li, Guo .
SENSORS, 2022, 22 (09)
[10]   Spatial Pyramid Pooling in Deep Convolutional Networks for Visual Recognition [J].
He, Kaiming ;
Zhang, Xiangyu ;
Ren, Shaoqing ;
Sun, Jian .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2015, 37 (09) :1904-1916