Chip Size Minimization for Wide and Ultrawide Bandgap Power Devices

被引:12
作者
Wang, Boyan [1 ]
Xiao, Ming [1 ]
Zhang, Zichen [1 ]
Wang, Yifan [1 ]
Qin, Yuan [1 ]
Song, Qihao [1 ]
Lu, Guo-Quan [1 ]
Ngo, Khai [1 ]
Zhang, Yuhao [1 ]
机构
[1] Virginia Polytech Inst & State Univ, Ctr Power Elect Syst CPES, Blacksburg, VA 24060 USA
关键词
Chip size; codesign; drift region; packag-ing; power devices; power electronics; power loss; switch-ing frequency; ultrawide bandgap; wide bandgap (WBG); THERMAL-CONDUCTIVITY; GAN; PERFORMANCE; SIMULATION;
D O I
10.1109/TED.2022.3232309
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
size (Achip) optimization is key to the accurate analysis of device and material costs and the design of multichip modules. It is particularly critical for wide bandgap (WBG) and ultrawide bandgap (UWBG) power devices due to high material cost. Moreover, the designs of A(chip) and the drift region thickness (W-dr) and doping concentration (N-dr) are interdependent, requiring their co-optimization. Current design practices for Achip, Wdr, and N(dr )rely on optimizing electrical parameters. This work presents a new, holistic, electrothermal approach to opti-mize Achip for a given set of target specifications, including breakdown voltage (BV), conduction current (I0), and switch-ing frequency (f). The conduction and switching losses of the device are considered as well as the heat dissipation in the chip and its package. For a given BV and Io, the optimal Achip, Wdr, and Ndr show a strong dependence on f and thermal management. Such dependencies are missing in prior A(chip) design methods. This approach is applied to compare the optimal A(chip) of WBG and UWBG devices up to a BV over 10 kV and f of 1 MHz. Our approach offers more accurate cost analysis and design guidelines for power modules.
引用
收藏
页码:633 / 639
页数:7
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