Probing single electron spins with an atomic force microscope for quantum applications

被引:0
|
作者
Sellies, Lisanne [1 ]
Spachtholz, Raffael [1 ]
机构
[1] Univ Regensburg, Regensburg, Germany
关键词
Physics; Quantum physics; Quantum information; RESONANCE;
D O I
10.1038/d41586-023-03650-x
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Electron spin resonance is a standard method for studying the structure of chemical compounds, and it can also be used to control quantum spin states. Combining electron spin resonance with atomic force microscopy allows single spins to be manipulated in single molecules - with potential applications in quantum computing and elsewhere.
引用
收藏
页数:36
相关论文
共 50 条
  • [21] A Horizontal atomic force microscope and its applications
    Zhang, HJ
    Zhang, DX
    Shi, Y
    Nanophotonics, Nanostructure, and Nanometrology, 2005, 5635 : 502 - 511
  • [22] Active interaction force identification for atomic force microscope applications
    Fang, Y
    Feemster, M
    Dawson, D
    Jalili, N
    PROCEEDINGS OF THE 41ST IEEE CONFERENCE ON DECISION AND CONTROL, VOLS 1-4, 2002, : 3678 - 3683
  • [23] Single-chip atomic force microscope
    Hafizovic, S
    Volden, T
    Barrettino, D
    Kirstein, KU
    Hierlemann, A
    MEMS 2005 Miami: Technical Digest, 2005, : 638 - 641
  • [24] Force measurements with the atomic force microscope: Technique, interpretation and applications
    Butt, HJ
    Cappella, B
    Kappl, M
    SURFACE SCIENCE REPORTS, 2005, 59 (1-6) : 1 - 152
  • [25] Probing single biomolecules with atomic force microscopy
    Fritz, J
    Anselmetti, D
    Jarchow, J
    FernandezBusquets, X
    JOURNAL OF STRUCTURAL BIOLOGY, 1997, 119 (02) : 165 - 171
  • [26] Growth of InGaAs-capped InAs quantum dots characterized by atomic force microscope and scanning electron microscope
    Chen, SD
    Tsai, CY
    Lee, SC
    JOURNAL OF NANOPARTICLE RESEARCH, 2004, 6 (04) : 407 - 410
  • [27] Growth of InGaAs-capped InAs quantum dots characterized by Atomic Force Microscope and Scanning Electron Microscope
    Shen-de Chen
    Chiou-yun Tsai
    Si-chen Lee
    Journal of Nanoparticle Research, 2004, 6 : 407 - 410
  • [28] Atomic force microscope integrated with a scanning electron microscope for tip fabrication
    Walters, D.A., 1600, American Inst of Physics, Woodbury, NY, United States (65):
  • [29] Cross-sectional atomic force microscope in scanning electron microscope
    Park, Byong Chon
    Song, Woon
    Kim, Dal Hyun
    Lee, Ju-Yeop
    Hong, Jaewan
    Kim, Jin Seung
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2014, 32 (06):
  • [30] Development of a versatile atomic force microscope within a scanning electron microscope
    Fukushima, Kimitake, 2000, JJAP, Tokyo, Japan (39):