Time-Resolved Multielectron Coincidence Spectroscopy of Double Auger-Meitner Decay Following Xe 4d Ionization

被引：2

作者：

Zhang, Pengju ^{[1
]}

Trester, Joel ^{[1
]}

Ueda, Kiyoshi ^{[1
,2
,3
]}

Han, Meng ^{[1
,4
]}

Balciunas, Tadas

Worner, Hans Jakob ^{[1
]}

机构：

[1] Swiss Fed Inst Technol, Lab Phys Chem, Vladimir Prelog Weg 2, CH-8093 Zurich, Switzerland

[2] Tohoku Univ, Dept Chem, Sendai 9808578, Japan

[3] ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 201210, Peoples R China

[4] Kansas State Univ, Dept Phys, JR Macdonald Lab, Manhattan, KS 66506 USA

来源：

PHYSICAL REVIEW LETTERS | 2024年 / 132卷 / 08期

基金：

欧洲研究理事会; 瑞士国家科学基金会;

关键词：

ELECTRON; XENON; PHOTOIONIZATION; CONFIGURATIONS; THRESHOLD;

D O I：

10.1103/PhysRevLett.132.083201

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We introduce time-resolved multielectron coincidence spectroscopy and apply it to the double AugerMeitner (AM) emission process following xenon 4d photoionization. The photoelectron and AM electron(s) are measured in coincidence by using a magnetic-bottle time-of-flight spectrometer, enabling an unambiguous assignment of the complete cascade pathways involving two AM electron emissions. In the presence of a near-infrared (NIR) laser pulse, the intermediate Xe2+* state embedded in the Xe3+ continuum is probed through single NIR photon absorption and the lifetime of this intermediate Xe2+* state is directly obtained as (109 +/- 22) fs.

引用

页数：6

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