Optical Readout of the Mechanical Properties of Silica Mesoporous Thin Films Using Plasmonic Nanoantennas

被引:3
|
作者
Boggiano, Hilario D. [1 ]
Ramallo, Juan Ignacio [2 ,3 ]
Nan, Lin [4 ]
Litwiller, Andres [1 ]
Cortes, Emiliano [4 ]
Maier, Stefan A. [4 ,5 ,6 ]
Grinblat, Gustavo [1 ,7 ]
Fuertes, Maria Cecilia [3 ]
Angelome, Paula C. [3 ]
Bragas, Andrea V. [1 ,7 ]
机构
[1] Univ Buenos Aires, Fac Ciencias Exactas & Nat, Dept Fis, RA-1428 Buenos Aires, DF, Argentina
[2] Univ Nacl San Martin, Inst Sabato, Comis Nacl Energia Atom, RA-1650 San Martin, Buenos Aires, Argentina
[3] Consejo Nacl Invest Cient & Tecn, Comis Nacl Energia Atom, Ctr Atom Constituyentes, Gerencia Quim & INN, RA-1650 San Martin, Buenos Aires, Argentina
[4] Ludwig Maximilians Univ Munchen, Fac Phys, Nanoinst Munich, Chair Hybrid Nanosyst, D-80539 Munich, Germany
[5] Monash Univ, Sch Phys & Astron, Clayton, Vic 3800, Australia
[6] Imperial Coll London, Dept Phys, London SW7 2AZ, England
[7] Univ Buenos Aires, Inst Fis Buenos Aires IFIBA, CONICET, RA-1428 Buenos Aires, DF, Argentina
基金
英国工程与自然科学研究理事会;
关键词
mesoporous oxides; plasmonic nanoantennas; coherent acoustic phonons; mechanical properties; nanophononics; nanomechanics; MODULUS; POROSITY;
D O I
10.1021/acsphotonics.3c00874
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this work, we apply the recently developed frequency shift of nanoantennas (FRESA) technique to measure the Young's modulus of thin mesoporous films at GHz frequencies as a function of porosity with local precision. The method measures changes in the mechanical oscillation frequency of optically excited plasmonic nanoantennas with modification of their surrounding medium. The values obtained range from 4 to 10 GPa for porosities extending from 35 to 4%, compatible with reports on films grown under similar conditions. We further find comparable results when using the well-established nanoindentation (NI) technique, validating the new method. By analysis of the nanoresonator's quality factor, the measurement reveals an excellent interfacial adhesion of the films to the nanoantennas. Different from most other characterization techniques, FRESA provides elastic modulus determination at GHz frequencies, relevant for the operation of current devices. Furthermore, FRESA exhibits, in principle, no limitations in terms of film thickness, in contrast to the NI, which is strongly affected by the stiffness of the substrate for ultrathin films.
引用
收藏
页码:3998 / 4005
页数:8
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