Noise reduction;
Noise measurement;
Signal to noise ratio;
Wavelet transforms;
Wavelet domain;
Discrete wavelet transforms;
Wavelet analysis;
Signal denoising;
Wavelet selection;
decomposition level selection;
detail components;
signal denoising;
sparsity;
wavelet denoising;
wavelet transform;
DECOMPOSITION LEVELS;
CLASSIFICATION;
IMAGES;
D O I:
10.1109/ACCESS.2024.3377664
中图分类号:
TP [自动化技术、计算机技术];
学科分类号:
0812 ;
摘要:
Wavelet denoising plays a key role in removing noise from signals and is widely used in many applications. In denoising, selection of the mother wavelet is desirable for maximizing the separation of noise and signal coefficients in the wavelet domain for effective noise thresholding. At present, wavelet selection is carried out in a heuristic manner or using a trial-and-error that is time consuming and prone to error, including human bias. This paper introduces a universal method to select optimal wavelets based on the sparsity of Detail components in the wavelet domain, an empirical approach. A mean of sparsity change ( mu sc ) parameter is defined that captures the mean variation of noisy Detail components. The efficacy of the presented method is tested on simulated and experimental signals from Electron Spin Resonance spectroscopy at various SNRs. The results reveal that the mu sc values of signal vary abruptly between wavelets, whereas for noise it displays similar values for all wavelets. For low Signal-to-Noise Ratio (SNR) data, the change in mu sc between highest and second highest value is approximate to 8-10% and for high SNR data it is around 5%. The mean of sparsity change increases with the SNR of the signal, which implies that multiple wavelets can be used for denoising a signal, whereas, the signal with low SNR can only be efficiently denoised with a few wavelets. Either a single wavelet or a collection of optimal wavelets (i.e., top five wavelets) should be selected from the highest mu sc values. The code is available on GitHub and the signalsciencelab.com website.
机构:
Univ Carlos III Madrid, Dept Mech Engn, Campus Leganes,Avda Univ 30, Madrid 28911, SpainUniv Carlos III Madrid, Dept Mech Engn, Campus Leganes,Avda Univ 30, Madrid 28911, Spain
Zamorano, Marta
;
Gomez Garcia, Maria Jesus
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机构:
Univ Carlos III Madrid, Dept Mech Engn, Campus Leganes,Avda Univ 30, Madrid 28911, SpainUniv Carlos III Madrid, Dept Mech Engn, Campus Leganes,Avda Univ 30, Madrid 28911, Spain
Gomez Garcia, Maria Jesus
;
Castejon, Cristina
论文数: 0引用数: 0
h-index: 0
机构:
Univ Carlos III Madrid, Dept Mech Engn, Campus Leganes,Avda Univ 30, Madrid 28911, SpainUniv Carlos III Madrid, Dept Mech Engn, Campus Leganes,Avda Univ 30, Madrid 28911, Spain
机构:
Univ Carlos III Madrid, Dept Mech Engn, Campus Leganes,Avda Univ 30, Madrid 28911, SpainUniv Carlos III Madrid, Dept Mech Engn, Campus Leganes,Avda Univ 30, Madrid 28911, Spain
Zamorano, Marta
;
Gomez Garcia, Maria Jesus
论文数: 0引用数: 0
h-index: 0
机构:
Univ Carlos III Madrid, Dept Mech Engn, Campus Leganes,Avda Univ 30, Madrid 28911, SpainUniv Carlos III Madrid, Dept Mech Engn, Campus Leganes,Avda Univ 30, Madrid 28911, Spain
Gomez Garcia, Maria Jesus
;
Castejon, Cristina
论文数: 0引用数: 0
h-index: 0
机构:
Univ Carlos III Madrid, Dept Mech Engn, Campus Leganes,Avda Univ 30, Madrid 28911, SpainUniv Carlos III Madrid, Dept Mech Engn, Campus Leganes,Avda Univ 30, Madrid 28911, Spain