FORMATION OF Mn4Si7/Si(111), CrSi2/Si(111), AND CoSi2/Si(111) THIN FILMS AND EVALUATION OF THEIR OPTICALLY DIRECT AND INDIRECT BAND GAPS

被引:4
作者
Dovranov, K. T. [1 ]
Normuradov, M. T. [1 ]
Davranov, Kh. T. [1 ]
Bekpulatov, I. R. [1 ]
机构
[1] Karshi State Univ, Karshi 180100, Uzbekistan
来源
UKRAINIAN JOURNAL OF PHYSICS | 2024年 / 69卷 / 01期
关键词
FTIR spectroscopy; transmission spectroscopy; UV absorption; band gap; thin films;
D O I
10.15407/ujpe69.1.20
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Now, silicon -based heterostructured nanocomposites are of great interest. Despite the fact that silicon semiconductor films (crystalline, polycrystalline, amorphous) have been systematically studied for a long time, heterostructural films are new materials, the study of which began relatively recently. We will produce and investigate the properties of heterostructured Mn4Si7/Si(111), CrSi2/Si(111), and CoSi2/Si(111) thin films using infrared and ultraviolet spectroscopies. Absorption, transmission, and diffuse reflectance spectra are obtained applying FTIR spectroscopy instruments and a UV spectrophotometer. The band gap energies calculated from the transmission spectra are in the interval 0.32-1.31 eV for films deposited on the silicon substrates and in the interval 0.36-1.25 eV for the glass substrates.
引用
收藏
页码:20 / 25
页数:6
相关论文
共 50 条
[41]   Preferential grain growth and improved fatigue endurance in Sr substituted PZT thin films on Pt(111)/TiOx/SiO2/Si substrates [J].
Karan, N. K. ;
Thomas, R. ;
Pavunny, S. P. ;
Saavedra-Arias, J. J. ;
Murari, N. M. ;
Katiyar, R. S. .
JOURNAL OF ALLOYS AND COMPOUNDS, 2009, 482 (1-2) :253-255
[42]   Deposition of NiFe(200) and NiFe(111) textured films onto Si/SiO2 substrates by DC magnetron sputtering [J].
Dzhumaliev, A. S. ;
Nikulin, Yu. V. ;
Filimonov, Yu. A. .
PHYSICS OF THE SOLID STATE, 2016, 58 (05) :1053-1057
[43]   Nucleation and Growth Dynamics of MBE-Grown Topological Insulator Bi2Te3 Films on Si (111) [J].
Borisova, Svetlana ;
Krumrain, Julian ;
Mussler, Gregor ;
Luysberg, Martina ;
Gruetzmacher, Detlev .
PHYSICS OF SEMICONDUCTORS, 2013, 1566 :191-+
[44]   nm-Co2Si, CoSi and CoSi2 silicide films from the single source precursor CoSiCl3(CO)4 in the presence of SiH4 [J].
Prokop, J ;
Zybill, CE ;
Veprek, S .
THIN SOLID FILMS, 2000, 359 (01) :39-45
[45]   Formation of large-grain-sized BaSi2 epitaxial layers grown on Si(111) by molecular beam epitaxy [J].
Baba, M. ;
Toh, K. ;
Toko, K. ;
Hara, K. O. ;
Usami, N. ;
Saito, N. ;
Yoshizawa, N. ;
Suemasu, T. .
JOURNAL OF CRYSTAL GROWTH, 2013, 378 :193-197
[46]   Effects of Mn doping on dielectric and ferroelectric properties of (Pb, Sr)TiO3 films on (111) Pt/Ti/SiO2/Si substrates [J].
Yang, J. ;
Meng, X. J. ;
Shen, M. R. ;
Sun, J. L. ;
Chu, J. H. .
JOURNAL OF APPLIED PHYSICS, 2009, 106 (09)
[47]   Energy level alignment at the Si(111)/RCA-SiO2/copper(II) phthalocyanine ultra-thin film interface [J].
Krzywiecki, Maciej ;
Grzadziel, Lucyna .
APPLIED SURFACE SCIENCE, 2014, 311 :740-748
[48]   Ion beam induced chemical and morphological changes in TiO2 films deposited on Si(111) surface by pulsed laser deposition [J].
Mohanta, R. R. ;
Medicherla, V. R. R. ;
Mohanta, K. L. ;
Nayak, Nimai C. ;
Majumder, S. ;
Solanki, V. ;
Varma, Shikha ;
Bapna, Komal ;
Phase, D. M. ;
Sathe, V. .
APPLIED SURFACE SCIENCE, 2015, 325 :185-191
[49]   Electrical characterization and conduction mechanism of impurity-doped BaSi2 films grown on Si(111) by molecular beam epitaxy [J].
Khan, M. Ajmal ;
Saito, T. ;
Nakamura, K. ;
Baba, M. ;
Du, W. ;
Toh, K. ;
Toko, K. ;
Suemasu, T. .
THIN SOLID FILMS, 2012, 522 :95-99
[50]   DC sputtering of highly c-axis AlN films on top of 3C-SiC (111)-on-Si (111) substrates under various N2 concentrations [J].
Iqbal, Abid ;
Walker, Glenn ;
Hold, Leonie ;
Fernandes, Alanna ;
Iacopi, Alan ;
Mohd-Yasin, Faisal .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2017, 35 (06)