Highly Reliable Temperature Sensor Based on p-GaN/AlGaN/GaN Hybrid Anode Diode with Wide Operation Temperature from 73 K to 573 K

被引:7
|
作者
Yang, An [1 ,2 ,3 ]
Wei, Xing [1 ,3 ]
Shen, Wenchao [3 ]
Hu, Yu [2 ,3 ]
Chen, Tiwei [1 ,3 ]
Wang, Heng [3 ]
Zhou, Jiaan [3 ]
Xing, Runxian [3 ]
Zhang, Xiaodong [1 ,3 ,4 ,5 ]
Yu, Guohao [1 ,3 ]
Fan, Yaming [3 ,4 ,5 ]
Cai, Yong [1 ,3 ]
Zeng, Zhongming [1 ,3 ,4 ,5 ]
Zhang, Baoshun [1 ,3 ]
机构
[1] Univ Sci & Technol China, Sch Nanotech & Nanob, Hefei 230026, Peoples R China
[2] Univ Sci & Technol China, Nano Sci & Nano Technol Inst, Suzhou 215123, Peoples R China
[3] Chinese Acad Sci, Suzhou Inst Nanotech & Nanob, Nanofabricat Facil, Suzhou 215123, Peoples R China
[4] Jiangxi Inst Nanotechnol, Nanchang Key Lab Adv Packaging, Nanchang 330200, Peoples R China
[5] Jiangxi Inst Nanotechnol, Div Nanodevices & Technol, Nanchang 330200, Peoples R China
基金
中国国家自然科学基金;
关键词
p-GaN; AlGaN; GaN; temperature sensor; semiconductor materials; SCHOTTKY-BARRIER DIODE; SENSITIVITY; DEVICES;
D O I
10.3390/cryst13040620
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
A high-performance temperature sensor based on a p-GaN/AlGaN/GaN hybrid anode diode (HPT-HAD) fabricated by hydrogen plasma treatment is demonstrated. The sensor exhibits accurate and stable temperature responses from 73 to 573 K. The forward anode voltage is linearly proportional to the temperature over the measured temperature range at a fixed current. At a forward current density of 10(-7) mA/mm, the device achieves a maximum sensitivity of 1.93 mV/K. The long-time anode current stress measurement reveals that the HPT-HAD shows almost no degradation even at 573 K for 1 h at a current of 100 mu A, and the anode voltage shifts only 120 mV at 573 K for 1000 s at 1 nA. This work shows that the HPT-HAD temperature sensor can be reliably operated over a wide temperature range from cryogenic to high temperatures, so can be used in a variety of extreme environments.
引用
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页数:10
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