Spatially resolved power conversion efficiency for perovskite solar cells via bias-dependent photoluminescence imaging

被引:12
作者
Bui, Anh Dinh [1 ]
Nguyen, Dang-Thuan [1 ]
Fell, Andreas [2 ,3 ]
Mozaffari, Naeimeh [4 ]
Ahmad, Viqar [1 ]
Duong, The
Li, Li [5 ]
Truong, Thien N. [1 ]
Wibowo, Ary Anggara [1 ]
Nguyen, Khoa [1 ]
Fischer, Oliver [2 ,6 ]
Schindler, Florian [2 ]
Schubert, Martin C. [2 ]
Weber, Klaus J. [1 ]
White, Thomas P. [1 ]
Catchpole, Kylie R. [1 ]
Macdonald, Daniel [1 ]
Nguyen, Hieu T. [1 ]
机构
[1] Australian Natl Univ, Sch Engn, Canberra, ACT 2601, Australia
[2] Fraunhofer Inst Solar Energy Syst ISE, Heidenhofstr 2, Freiburg 79110, Germany
[3] AF Simulat GmbH, Landstr 33a, D-79232 March, Germany
[4] Monash Univ, Dept Mat Sci & Engn, Melbourne, Vic 3800, Australia
[5] Australian Natl Univ, Dept Elect Mat Engn, Australian Natl Fabricat Facil ANFF, Canberra, ACT 2601, Australia
[6] Univ Freiburg, Chair Photovolta Energy Convers, Dept Sustainable Syst Engn INATECH, Emmy Noether Str 2, D-79110 Freiburg, Germany
基金
澳大利亚研究理事会;
关键词
DEGRADATION; RECOMBINATION; PERFORMANCE;
D O I
10.1016/j.xcrp.2023.101641
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Hybrid organic-inorganic perovskite solar cells (PSCs) offer a highly promising solution for achieving low-cost, high-performance photo-voltaics. However, to accelerate the development of the PSC tech-nology, it is critical to quantify local performance losses and identify problematic regions across the device. Obtaining spatially resolved information is essential not only for device fabrication but also for material optimization, particularly when scaling up the perovskite technology. In this work, we propose an imaging-based approach to spatially resolve local series resistance, power conversion efficiency (PCE), and charge-transfer efficiency across PSCs by em-ploying bias-dependent photoluminescence (PL). By analyzing these parameters' images, we find a significant correlation between the charge-transfer efficiency and the PCE. However, we observe a weak correlation between the intensity of the PL image taken under open-circuit conditions and the final PCE of the device. This finding highlights the risk of misinterpreting the device performance if us-ing only PL intensities. Moreover, we demonstrate the impact of the voltage-dependent series resistance on the accuracy of the de-vice simulation. This work presents another important contribution of luminescence imaging to the research and development of the perovskite solar cells technology.
引用
收藏
页数:14
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