Oscillatory Order-Disorder Transition during Layer-by-Layer Growth of Indium Selenide

被引:7
作者
Chen, Zhi [1 ,2 ]
Sun, Mingzi [3 ]
Li, Haohan [4 ]
Huang, Bolong [3 ,5 ]
Loh, Kian Ping [1 ,4 ,6 ]
机构
[1] Shenzhen Univ, Int Collaborat Lab Mat Optoelect Sci & Technol ICL, Shenzhen 518060, Peoples R China
[2] Shenzhen Univ, Coll Chem & Environm Engn, Shenzhen 518060, Peoples R China
[3] Hong Kong Polytech Univ, Dept Appl Biol & Chem Technol, Kowloon, Hong Kong 999077, Peoples R China
[4] Natl Univ Singapore, Dept Chem, Singapore 117543, Singapore
[5] Hong Kong Polytech Univ, Res Ctr Carbon Strateg Catalysis, Kowloon, Hong Kong 999077, Peoples R China
[6] Hong Kong Polytech Univ, Dept Appl Phys, Kowloon, Hong Kong 999077, Peoples R China
基金
中国国家自然科学基金;
关键词
scanning tunneling spectroscopy; indium selenide; order-disorder transition; layer-by-layer growth; IN2SE3; FERROELECTRICITY;
D O I
10.1021/acs.nanolett.2c04785
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
It is important to understand the polymorph transition and crystal-amorphous phase transition in In2Se3 to tap the potential of this material for resistive memory storage. By monitoring layer-by-layer growth of beta-In(2)Se(3 )during molecular beam epitaxy (MBE), we are able to identify a cyclical order- disorder transition characterized by a periodic alternation between a glassy-like metastable subunit cell film consisting of n < 5 sublayers (nth layers = the number of subunit cell layers), and a highly crystalline beta-In2Se3 at n = 5 layers. The glassy phase shows an odd-even alternation between the indium-cluster layer (n = 1, 3) and an In-Se solid solution (n = 2, 4), which suggests the ability of In and Se atoms to diffuse, aggregate, and intermix. These dynamic natures of In and Se atoms contribute to a defect-driven memory resistive behavior in current-voltage sweeps that is different from the ferroelectric switching of alpha-In2Se3 .
引用
收藏
页码:1077 / 1084
页数:8
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