Analytical drain current model development of twin gate TFET in subthreshold and super threshold regions

被引:11
|
作者
Raut, Pratikhya [1 ]
Nanda, Umakanta [1 ]
Panda, Deepak Kumar [1 ]
机构
[1] VIT AP Univ, Sch Elect Engn, Near Vijayawada 522237, India
来源
MICROELECTRONICS JOURNAL | 2023年 / 135卷
关键词
Analytic model; Subthreshold; Super threshold region; Transconductance to drain current ratio; Twin gate TFET; CMOS; CIRCUITS; VOLTAGE;
D O I
10.1016/j.mejo.2023.105761
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this work, an analytical model for a twin gate Tunnel Field Effect Transistor's drain current operating in the subthreshold and superthreshold regions is proposed. Using this drain current model, the ratio of transconductance to drain current, a crucial metric for the integrated analog circuit design technique, has been retrieved. Due to the simplicity of this approach, it may be quickly implemented for any type of dual gate TFETs by adjusting a few parameters. Comparing the drain current calculated by this analytical model to the drain current simulated by the 2D-Sentaurus TCAD software demonstrates the Tunnel FET's authenticity. The proposed analytical method can be used to achieve the appropriate transconductance for operating Tunnel FETs in the gigahertz region with very low milliwatt power consumption.
引用
收藏
页数:8
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