A full range of defect passivation strategy targeting efficient and stable planar perovskite solar cells

被引:23
作者
Sun, Yansen [1 ,2 ,3 ]
Yang, Shuo [4 ]
Pang, Zhenyu [1 ,2 ,3 ]
Jiang, Haipeng [5 ]
Chi, Shaohua [1 ,2 ,3 ]
Sun, Xiaoxu [1 ,2 ,3 ]
Fan, Lin [1 ]
Wang, Fengyou [1 ]
Liu, Xiaoyan [1 ]
Wei, Maobin [1 ]
Yang, Lili [1 ]
Yang, Jinghai [1 ]
机构
[1] Jilin Normal Univ, Key Lab Funct Mat Phys & Chem, Minist Educ, Changchun 130103, Peoples R China
[2] Chinese Acad Sci, Changchun Inst Opt, Fine Mech & Phys, Changchun 130033, Peoples R China
[3] Univ Chinese Acad Sci, Beijing 100049, Peoples R China
[4] Changchun Univ, Coll Sci, Changchun 130022, Peoples R China
[5] Jiangsu Univ, Sch Mat Sci & Engn, Zhenjiang 212013, Peoples R China
关键词
Photovoltaic performance; Gradient heterojunction; Defect passivation; Moisture and thermal stability; Charge transport properties; ELECTRON-TRANSPORT LAYER; LEWIS-BASE PASSIVATION; PERFORMANCE; RECOMBINATION; ENHANCEMENT; STABILITY; CIRCUIT; CATION;
D O I
10.1016/j.cej.2022.138800
中图分类号
X [环境科学、安全科学];
学科分类号
08 ; 0830 ;
摘要
Defects and inferior charge transport dynamics within devices are key issues that inhibit the improvements of photovoltaic performance and stability. Developing facile and feasible strategies for synchronous passivation of defects regarding charge transport layers (CTLs), perovskite films and their interfaces, and precise tuning of energy level structure, is a definite way to solve above problems. Herein, we develop a synergistic passivation strategy for perovskite films and bilateral interfaces to improve device performance. Firstly, an appropriate amount of phenylethylammonium chloride is adopted to modify SnO2 electron transport layer (ETL). The complexation reaction between N atoms in -NH2 and Sn4+ improve the agglomeration of SnO2 nanoparticles and film quality of SnO2 ETL. The presence of Cl- ions not only effectively fill oxygen vacancies within SnO2 ETL, but also participate in regulating crystal growth dynamics of perovskite films, thus improving electron transport properties at interface. Subsequently, p-type conducting material N,N'-Bis-(1-naphthalenyl)-N,N'-bis-phenyl(1,1 '-biphenyl)-4,4 '-diamine (NPB) is introduced into anti-solvent chlorobenzene during the preparation of perovskite films to further regulate the crystal quality and achieve full-range defect passivation. Particularly, the introduction of NPB helps to construct a gradient heterojunction between upper perovskite film and SpiroOMeTAD hole transport layer, thus reducing the accumulation of hole carriers near interface and further suppressing current-voltage hysteresis behavior of devices. Additionally, the hydrophobicity of NPB and full range of defect passivation greatly enhance the humidity and thermal stability of devices. Finally, a high power conversion efficiency of 21.88% is obtained with suppressed hysteresis and enhanced long-term stability. This work highlights the role of full-range defect passivation on CTLs, perovskite absorption layers and interfacial charge transport properties, which provide a novel concept for constructing high-performance and stable perovskite devices.
引用
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页数:10
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