Vacuum Nanoelectronics Based on Semiconductor Field-Emission Structures: Current State and Development Prospects. Review

被引:0
作者
Dyuzhev, N. A. [1 ]
Evsikov, I. D. [1 ]
机构
[1] Natl Res Univ Elect Technol MIET, Moscow, Russia
基金
俄罗斯基础研究基金会;
关键词
field emission; CMOS technology; semiconductor field-emission nanostructures; silicon; silicon carbide; ELECTRON-EMISSION; EMITTER; FABRICATION; CATHODE; DIAMOND; ARRAYS; SURFACES; DEVICES; POINT; LOGIC;
D O I
10.1134/S1063782623010037
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The development of semiconductor integrated technology and the transition to nanometer resolution of the lithographic process has led to the development of semiconductor field-emission structures. However, the set of technologies for manufacturing field-emission devices has not, at present, been widely introduced into production and commercialization due to their short service life and insufficient operational stability. The work provides a comparative analysis of the significant results obtained to date on the development of semiconductor field-emission structures with a nanoscale conduction channel in order to assess the current state and prospects for further development of vacuum nanoelectronics. Technological and operational problems in the development of nanoscale field-emission triode structures using various semiconductor materials are analyzed. The progress achieved in the field of integrating nanoscale field-emission structures with standard complementary metal-oxide-semiconductot (CMOS) transistors is shown. Possible areas of the application of vacuum nanoelectronic structures are considered. The current tasks of this scientific field are described, as well as problems arising in the process of introducing the elemental base of vacuum nanoelectronics into the cycle of development and commercialization of vacuum IC technology.
引用
收藏
页码:65 / 80
页数:16
相关论文
共 99 条
[91]   Fabrication and characterization of well-aligned and ultra-sharp silicon nanotip array [J].
Wu, Chi-Chang ;
Ou, Keng-Liang ;
Tseng, Ching-Li .
NANOSCALE RESEARCH LETTERS, 2012, 7
[92]   Field Electron Emission Characteristics and Physical Mechanism of Individual Single-Layer Graphene [J].
Xiao, Zhiming ;
She, Juncong ;
Deng, Shaozhi ;
Tang, Zikang ;
Li, Zhibing ;
Lu, Jianming ;
Xu, Ningsheng .
ACS NANO, 2010, 4 (11) :6332-6336
[93]   Optimization of a Field Emission Electron Source Based on Nano-Vacuum Channel Structures [J].
Xu, Ji ;
Lin, Congyuan ;
Shi, Yongjiao ;
Li, Yu ;
Zhao, Xueliang ;
Zhang, Xiaobing ;
Zhang, Jian .
MICROMACHINES, 2022, 13 (08)
[94]   Nanoscale vacuum channel transistor with in-plane collection structure [J].
Xu, Ji ;
Hu, Hai ;
Yang, Wenxin ;
Li, Chi ;
Shi, Yutong ;
Shi, Yongjiao ;
Wang, Qilong ;
Zhang, Xiaobing .
NANOTECHNOLOGY, 2020, 31 (06)
[95]   Field Emission From a MOSFET-Controlled ZnO-Nanowire Cold Cathode [J].
Yang, Wenjie ;
She, Juncong ;
Deng, Shaozhi ;
Xu, Ningsheng .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2012, 59 (12) :3641-3646
[96]   Far UVC light for E. coli disinfection generated by carbon nanotube cold cathode and sapphire anode [J].
Yoo, Sung Tae ;
Lee, Jee Youn ;
Rodiansyah, Alfi ;
Yune, Tae Young ;
Park, Kyu Chang .
CURRENT APPLIED PHYSICS, 2021, 28 :93-97
[97]   Comparison of field emission performances and durability of three nanocarbon materials [J].
Youh, Meng-Jey ;
Lin, Chun-Shuan ;
Pu, Nen-Wen ;
Liu, Yih-Ming ;
Youh, Ru-Yi ;
Li, Hao-Qian ;
Tang, Pei-Yu ;
Lin, Ming-Hsien ;
Ger, Ming-Der .
VACUUM, 2020, 177
[98]   Gated Si-Tip With On-Tip Integrated Gate-All-Around Field Effect Transistor for Actively Controlled Field Electron Emission [J].
Zeng, Miaoxuan ;
Huang, Yifeng ;
Huang, Yuan ;
Chen, Jun ;
She, Juncong ;
Deng, Shaozhi .
IEEE ELECTRON DEVICE LETTERS, 2022, 43 (03) :466-469
[99]   A Cylindrical Triode Ultrahigh Vacuum Ionization Gauge with a Carbon Nanotube Cathode [J].
Zhang, Jian ;
Wei, Jianping ;
Li, Detian ;
Zhang, Huzhong ;
Wang, Yongjun ;
Zhang, Xiaobing .
NANOMATERIALS, 2021, 11 (07)