Long term experimental verification of a single chip quantum random number generator fabricated on the InP platform

被引：5

作者：

Chrysostomidis, Themistoklis ^{[1
]}

Roumpos, Ioannis ^{[1
]}

Outerelo, David Alvarez ^{[2
]}

Troncoso-Costas, Marcos ^{[3
]}

Moskalenko, Valentina ^{[4
]}

Garcia-Escartin, Juan Carlos ^{[5
]}

Diaz-Otero, Francisco J. J. ^{[2
]}

Vyrsokinos, Konstantinos ^{[1
]}

机构：

[1] Aristotle Univ Thessaloniki, Sch Phys, Thessaloniki 54124, Greece

[2] Univ Vigo, atlanTT Res Ctr, El Telecommun, Campus Univ SN, Vigo 36310, Spain

[3] Dublin City Univ, Sch Elect Engn, Dublin, Ireland

[4] Keysight Technol, Santa Clara, CA USA

[5] Univ Valladolid, Dept Teoria Senal & Comunicac Ingn Telematica, Campus Miguel Delibes,Paseo Belen 15, Valladolid 47011, Spain

来源：

EPJ QUANTUM TECHNOLOGY | 2023年 / 10卷 / 01期

关键词：

Quantum random number generator; InP platform; Integrated optics; Integrated quantum devices;

D O I：

10.1140/epjqt/s40507-023-00162-5

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

This work presents the results from the experimental evaluation of a quantum random number generator circuit over a period of 300 minutes based on a single chip fabricated on the InP platform. The circuit layout contains a gain switched laser diode (LD), followed by a balanced Mach Zehnder Interferometer for proper light power distribution to the two arms of an unbalanced MZI incorporating a 65.4 mm long spiral waveguide that translates the random phase fluctuations to power variations. The LD was gain-switched at 1.3 GHz and the chip delivered a min-entropy of 0.5875 per bit after removal of the classical noise, resulting a total aggregate bit rate of 6.11 Gbps. The recoded data set successfully passed the 15-battery test NIST statistical test suite for all data sets.

引用

页数：15

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