Study of optical parameters of Te(1-x) (GeSe0.5) Scx (0 < x < 0.15) thin films for optical data storage applications

The present study describes the linear and nonlinear optical and electronic properties of Te(1-x)(GeSe0.5)Scx (x = 0, 0.05, 0.1, 0.15) thin films prepared by thermal evaporation technique. XRD, SEM and EDX have been utilized to investigate structural characterization, surface morphology and elemental composition respectively. Trans-mission spectra in spectral range from 400 to 2500 nm has been done by UV-Visible spectrophotometer to investigate the optical characteristics. Refractive index (n) and extinction coefficient (k) have been investigated. Tauc's relationship has been used for calculating optical absorption data. Absorption coefficient (alpha) has been examined using Urbach relation. The concept of Wemple-DiDomenico of single oscillator has been utilized for calculating non-linear refractive index. The dielectric properties, loss tangent and surface/volume energy loss functions were evaluated. The optical energy bandgap of thin films shows allowed indirect transition. The evolution of optical parameters makes studied composition suitable for various photonic applications.