Position-sensitive non-destructive detection of charged-particle bunches in low-energy beamlines

被引：2
作者：
Ringleb, Stefan [1 ]
Kiffer, Markus [1 ]
Ballentin, Jonas K. C. [1 ,2 ]
Stoehlker, Thomas [1 ,3 ,4 ]
Vogel, Manuel [4 ]
机构：
[1] Friedrich Schiller Univ Jena, D-07743 Jena, Germany
[2] Univ Vienna, A-1090 Vienna, Austria
[3] Helmholtz Inst Jena, D-07743 Jena, Germany
[4] GSI Helmholtzzentrum Schwerionenforsch, D-64291 Darmstadt, Germany
来源：
SCIENTIFIC REPORTS | 2023年 / 13卷 / 01期
关键词：
MASS MEASUREMENTS; TRAP; IONS;
D O I：
10.1038/s41598-023-45798-6
中图分类号：
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
We have developed and operated an electronic detection system for the non-destructive single-pass detection of bunches of charged particles in a beamline that allows for a measurement of their lateral position with respect to the central beamline axis on a shot-to-shot basis. It provides all features of our related development reported in Kiffer et al. (Rev Sci Instrum 90:113301, 2019), namely single-pass measurement of bunch length, kinetic energy and absolute charge, and is additionally designed to provide the lateral position of bunches with sub-mm accuracy. We show the setup, associated methods and provide characterizing measurements with bunches of highly charged ions in the keV regime of kinetic energy that demonstrate the capabilities and show a typical application.
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页数：9
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