VCSEL Cavity Loss and Gain Measurement for High-Speed Optical Interconnects

被引：0
作者：
Wang, Binhao [1 ,2 ]
Sorin, Wayne V. [3 ]
Tan, Michael R. T. [4 ]
机构：
[1] Chinese Acad Sci, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt & Photon, Xian 710119, Peoples R China
[2] Univ Chinese Acad Sci, Beijing 100049, Peoples R China
[3] Hewlett Packard Enterprise, Hewlett Packard Labs, Milpitas, CA 95035 USA
[4] Lumentum, San Jose, CA 95131 USA
来源：
JOURNAL OF LIGHTWAVE TECHNOLOGY | 2023年 / 41卷 / 16期
关键词：
Vertical-cavity surface-emitting lasers; optical interconnects; LINEWIDTH ENHANCEMENT FACTOR; DIFFERENTIAL GAIN; LASER;
D O I：
10.1109/JLT.2023.3262193
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Over 100 Gb/s Four-level Pulse-Amplitude Modulation (PAM4) Vertical-Cavity Surface-Emitting Laser (VCSEL) based optical interconnects require high speed, damped, and low relative intensity noise (RIN) VCSELs. Measurement techniques for intrinsic parameters are essential for optimizing VCSEL designs. The proposed VCSEL cavity round-trip loss and gain coefficient measurement provides the insight of VCSEL distributed Bragg reflectors (DBRs) and quantum well (QW) design. A simple VCSEL cavity model is described and excellent matching between the model and measurement is achieved.
引用
收藏
页码：5418 / 5424
页数：7
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