Full Counting Statistics of the Soft-Reset Process

被引：0

作者：

Hirose, Yutaka ^{[1
]}

机构：

[1] Panasonic Ind Co Ltd, Osaka 5718506, Japan

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 2023年 / 70卷 / 11期

关键词：

CMOS image sensor; cumulants; emission limited noise; Fano factor; full counting statistics (FCS); hard reset; hypoexponential distribution; Kolmogorov-Bateman (K-B) equation; KTC-noise; kurtosis; Markov chain; Poisson distribution; shot noise; skewness; soft reset (SR); SHOT-NOISE; SUPPRESSION; NUMBER;

D O I：

10.1109/TED.2023.3320095

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A general formula for the cumulants of the soft-or emission-limited reset process of a floating storage node is derived from a hypoexponential-type probability distribution function (PDF) that models the process as a continuous-time Markov chain. Emission-number dependences of the cumulant expansion of the probability functions are compared with those of the steady shot noise process described by a Poissonian distribution. The cumulants of the soft reset (SR) nearly overlap with those of the Poissonian-type distribution in the early period of the emission process; at larger emission number, the SR deviates from the shot noise of the Poissonian process approaching an asymptote. This accounts for the leveling off in the SR.

引用

页码：5769 / 5777

页数：9

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