Polymeric materials that can more effectively act as barriers to environmental factors such as moisture are of significant interest to the sensor fabrication industry. Moisture ingress may corrode metallic traces or cause the decohesion of bonded interfaces of flexible sensors. Often, imparting a higher degree of moisture resistance necessitates encapsulating the sensors or applying specialty coatings. In this study, a laser patterning process is used to modify standard polyimide coverfilms used in flexible sensor manufacturing. The study achieved patterned polyimide surfaces in the partial wetting Cassie-Baxter regime which displayed reduced moisture diffusivity compared to the original polyimide surface by an order of magnitude. These surfaces displayed periodic structures with deep channels, a high developed interfacial area ratio, and a low contact angle. A laser-patterned sensor that makes use of this coverfilm-enhancing technique is demonstrated. Avoiding the need to apply additional moisture resistant films and instead laser patterning existing coverfilms could provide significant benefits to the flexible sensor industry, simplifying the fabrication of more robust sensors that are less prone to environmental degradation. (c) 2023 Society of Manufacturing Engineers (SME). Published by Elsevier Ltd. All rights reserved.
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Univ Roma Tor Vergata, Dept Elect Engn, CHOSE, Via Politecn 1, I-00133 Rome, ItalyUniv Roma Tor Vergata, Dept Elect Engn, CHOSE, Via Politecn 1, I-00133 Rome, Italy
Dagar, Janardan
Castro-Hermosa, Sergio
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Univ Roma Tor Vergata, Dept Elect Engn, CHOSE, Via Politecn 1, I-00133 Rome, ItalyUniv Roma Tor Vergata, Dept Elect Engn, CHOSE, Via Politecn 1, I-00133 Rome, Italy
Castro-Hermosa, Sergio
Gasbarri, Matteo
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Univ Roma Tor Vergata, Dept Elect Engn, CHOSE, Via Politecn 1, I-00133 Rome, ItalyUniv Roma Tor Vergata, Dept Elect Engn, CHOSE, Via Politecn 1, I-00133 Rome, Italy
Gasbarri, Matteo
Palma, Alessandro L.
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Univ Roma Tor Vergata, Dept Elect Engn, CHOSE, Via Politecn 1, I-00133 Rome, ItalyUniv Roma Tor Vergata, Dept Elect Engn, CHOSE, Via Politecn 1, I-00133 Rome, Italy
Palma, Alessandro L.
Cina, Lucio
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Cicci Res Srl, Via Giordania 227, I-58100 Grosseto, ItalyUniv Roma Tor Vergata, Dept Elect Engn, CHOSE, Via Politecn 1, I-00133 Rome, Italy
Cina, Lucio
Matteocci, Fabio
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Univ Roma Tor Vergata, Dept Elect Engn, CHOSE, Via Politecn 1, I-00133 Rome, ItalyUniv Roma Tor Vergata, Dept Elect Engn, CHOSE, Via Politecn 1, I-00133 Rome, Italy
Matteocci, Fabio
Calabro, Emanuele
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Univ Roma Tor Vergata, Dept Elect Engn, CHOSE, Via Politecn 1, I-00133 Rome, ItalyUniv Roma Tor Vergata, Dept Elect Engn, CHOSE, Via Politecn 1, I-00133 Rome, Italy
Calabro, Emanuele
Di Carlo, Aldo
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Univ Roma Tor Vergata, Dept Elect Engn, CHOSE, Via Politecn 1, I-00133 Rome, Italy
Natl Univ Sci & Technol MISiS, Dept Semicond Elect & Device Phys, Leninskii Pr 4, Moscow 119049, RussiaUniv Roma Tor Vergata, Dept Elect Engn, CHOSE, Via Politecn 1, I-00133 Rome, Italy
Di Carlo, Aldo
Brown, Thomas M.
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Univ Roma Tor Vergata, Dept Elect Engn, CHOSE, Via Politecn 1, I-00133 Rome, ItalyUniv Roma Tor Vergata, Dept Elect Engn, CHOSE, Via Politecn 1, I-00133 Rome, Italy