A Single-Inverter-Based True Random Number Generator with On-Chip Clock-Tuning-Based Entropy Calibration Circuit

被引:0
作者
Wang, Xingyu [1 ]
Zhang, Ruilin [1 ]
Shinohara, Hirofumi [1 ]
机构
[1] Waseda Univ, Grad Sch Informat Prod & Syst, Kitakyushu 8080135, Japan
关键词
entropy; hardware security; charge injection; true random number generator (TRNG); post-processing; NIST tests; aging test;
D O I
10.1587/transfun.2023KEP0011
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
This paper introduces an inverter -based true random number generator (I-TRNG). It uses a single CMOS inverter to amplify thermal noise multiple times. An adaptive calibration mechanism based on clock tuning provides robust operation across a wide range of supply voltage 0.5 similar to 1.1 V and temperature -40 similar to 140(degrees)C. An 8 -bit Von -Neumann postprocessing circuit (VN8W) is implemented for maximum raw entropy extraction. In a 130 nm CMOS technology, the I-TRNG entropy source only occupies 635 mu m(2) and consumes 0.016 pJ/raw-bit at 0.6 V. The I-TRNG occupies 13406 mu m(2), including the entropy source, adaptive calibration circuit, and post -processing circuit. The minimum energy consumption of the I-TRNG is 1.38 pJ/bit at 0.5 V, while passing all NIST 800-22 and 800-90B tests. Moreover, an equivalent 15 -year life at 0.7 V, 25(degrees)C is confirmed by an accelerated NBTI aging test.
引用
收藏
页码:105 / 113
页数:9
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