Thermionic emission assisted charge conduction mechanisms across LaMnO3/La0.7Ca0.3MnO3 interface of manganite thin film structure

被引：5
作者：
Dadhich, Himanshu [1 ]
Rajyaguru, Bhargav [1 ]
Gadani, Keval [2 ]
Goswami, Hardika [1 ]
Rathod, V. R. [3 ]
Shrimali, V. G. [4 ]
Mukherjee, S. [5 ]
Asokan, K. [6 ,7 ]
Shah, N. A. [1 ]
Solanki, P. S. [1 ]
机构：
[1] Saurashtra Univ, Dept Phys, Rajkot 360005, India
[2] Indian Inst Teacher Educ, Ctr Educ, Dept Phys, Gandhinagar 382016, India
[3] H & HB Kotak Inst Sci, Rajkot 360001, India
[4] Govt Polytech, Rajkot 360003, India
[5] Mumbai Ctr, UGC DAE Consortium Sci Res, BARC Campus, Mumbai 400085, India
[6] Inter Univ Accelerator Ctr, Aruna Asaf Ali Marg, New Delhi 110067, India
[7] Univ Petr & Energy Studies, Dept Phys & Ctr Interdisciplinary Res, Dehra Dun 248007, India
来源：
CURRENT APPLIED PHYSICS | 2023年 / 50卷
关键词：
Thermionic emission; Charge conduction; Interface; Manganite; Thin film; Heterostructure; CURRENT-VOLTAGE CHARACTERISTICS; RESISTIVE SWITCHING MEMORIES; MAGNETOTRANSPORT PROPERTIES; TRANSPORT-PROPERTIES; TRANSITION; ELECTRORESISTANCE; RESISTANCE; EXCHANGE; STATE;
D O I：
10.1016/j.cap.2023.03.010
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
In the present communication, temperature dependence of resistive switching (RS) behavior across chemically grown LaMnO3/La0.7Ca0.3MnO3 (LMO/LCMO) interface have been discussed by employing various theoretical approaches and mechanisms. Temperature dependent RS behavior of LMO/LCMO interface highlights impactful switching between high resistance state (HRS) and low resistance state (LRS) under reverse bias mode through an active role of depletion region. Trapping-detrapping processes assisted charge conduction has been identified as a source of RS nature of LMO/LCMO interface. Thermionic emission model and space charge limited conduction (SCLC) mechanism have been employed to understand the charge conduction and charge transport across LMO/ LCMO interface. Present structure of Ag/LMO/LCMO/Ag has also been investigated for possible retention and endurance behaviors under different external parameters which verify the stability, reliability, reproducibility, non-volatile nature and applicability of LMO/LCMO interface.
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页码：1 / 12
页数：12
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