共 22 条
[2]
Chen H, 2018, PROC IEEE INT SYMP, P384, DOI 10.1109/ISIE.2018.8433822
[3]
Chung Y., 1996, J. Korean Inst. Electron. Inf. Eng, V23, P61
[4]
Clayton R.P., 2005, Introduction to Electromagnetic Compatibility, V2nd ed.
[5]
David M., 1994, A Handbook for EMC Testing and Measurement
[6]
DREWNIAK JL, 1995, EMC - A GLOBAL CONCERN : IEEE 1995 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SYMPOSIUM RECORD, P465, DOI 10.1109/ISEMC.1995.523602
[7]
Gonzalez D, 2002, ISIE 2002: PROCEEDINGS OF THE 2002 IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS, VOLS 1-4, P801, DOI 10.1109/ISIE.2002.1025835
[8]
Jung J.-C., 2001, Trans. Korean Inst. Power Electron, V6, P141
[9]
Kim C., 2010, J. Korean Inst. Electromagn. Eng. Sci, P73