Structural and functional properties of the nanostructured temperature-sensitive thick films based on Cu0.1Ni0.8Co0.2Mn1.9O4 and Cu0.8Ni0.1Co0.2Mn1.9O4 ceramics

被引：1
|
作者：
Klym, Halyna [1 ,2 ,4 ]
Hadzaman, Ivan [3 ]
Kostiv, Yuriy [1 ]
机构：
[1] Lviv Polytech Natl Univ, Lvov, Ukraine
[2] Ivan Franko Natl Univ Lviv, Lvov, Ukraine
[3] Drohobych Ivan Franko State Pedag Univ, Drogobych, Ukraine
[4] Lviv Polytech Natl Univ, S Bandery Str 12, UA-79013 Lvov, Ukraine
来源：
MOLECULAR CRYSTALS AND LIQUID CRYSTALS | 2023年 / 767卷 / 01期
关键词：
Degradation; microstructure; sensor nanoelectronics; stabilization; thick films; KOHLRAUSCH-WILLIAMS-WATTS; SPINEL; SYSTEMS;
D O I：
10.1080/15421406.2023.2225027
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
The phase composition, microstructure, and electrical properties of nanostructured thick films based on Cu0.1Ni0.8Co0.2Mn1.9O4 and Cu0.8Ni0.1Co0.2Mn1.9O4 ceramics were studied. Degradation tests were performed at 170 & DEG;C to stabilize the functional properties of thick films. The effect of thermal "shock" at the initial stage of isothermal exposure with subsequent stabilization of electrical resistance at this level was revealed. It is shown that high-temperature sensitivity and stabilization of electrical parameters in the studied single-phase thick films can be used for the production of thick-film sensor components for nanoelectronics devices.
引用
收藏
页码：51 / 59
页数：9
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