EDDMF: An Efficient Deep Discrepancy Measuring Framework for Full-Reference Light Field Image Quality Assessment

被引:13
作者
Zhang, Zhengyu [1 ]
Tian, Shishun [2 ]
Zou, Wenbin [2 ]
Morin, Luce [1 ]
Zhang, Lu [1 ]
机构
[1] Univ Rennes, INSA Rennes, CNRS, IETR,UMR 6164, F-35000 Rennes, France
[2] Shenzhen Univ, Coll Elect & Informat Engn, Guangdong Key Lab Intelligent Informat Proc, Shenzhen 518060, Peoples R China
基金
中国国家自然科学基金;
关键词
Measurement; Feature extraction; Distortion measurement; Data mining; Quality assessment; Image quality; Distortion; Light field; image quality assessment; full-reference; patch; deep-learning; NETWORK; VIDEO;
D O I
10.1109/TIP.2023.3329663
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
The increasing demand for immersive experience has greatly promoted the quality assessment research of Light Field Image (LFI). In this paper, we propose an efficient deep discrepancy measuring framework for full-reference light field image quality assessment. The main idea of the proposed framework is to efficiently evaluate the quality degradation of distorted LFIs by measuring the discrepancy between reference and distorted LFI patches. Firstly, a patch generation module is proposed to extract spatio-angular patches and sub-aperture patches from LFIs, which greatly reduces the computational cost. Then, we design a hierarchical discrepancy network based on convolutional neural networks to extract the hierarchical discrepancy features between reference and distorted spatio-angular patches. Besides, the local discrepancy features between reference and distorted sub-aperture patches are extracted as complementary features. After that, the angular-dominant hierarchical discrepancy features and the spatial-dominant local discrepancy features are combined to evaluate the patch quality. Finally, the quality of all patches is pooled to obtain the overall quality of distorted LFIs. To the best of our knowledge, the proposed framework is the first patch-based full-reference light field image quality assessment metric based on deep-learning technology. Experimental results on four representative LFI datasets show that our proposed framework achieves superior performance as well as lower computational complexity compared to other state-of-the-art metrics.
引用
收藏
页码:6426 / 6440
页数:15
相关论文
共 74 条
[1]  
Adelson E, 1991, Computational Models of Visual Processing, P3
[2]   Towards a quality metric for dense light fields [J].
Adhikarla, Vamsi Kiran ;
Vinkler, Marek ;
Sumin, Denis ;
Mantiuk, Rafal K. ;
Myszkowski, Karol ;
Seidel, Hans-Peter ;
Didyk, Piotr .
30TH IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR 2017), 2017, :3720-3729
[3]   High efficient snake order pseudo-sequence based light field image compression [J].
Amirpour, Hadi ;
Pereira, Manuela ;
Pinheiro, Antonio M. G. .
2018 DATA COMPRESSION CONFERENCE (DCC 2018), 2018, :397-397
[4]   Full-reference quality assessment of stereopairs accounting for rivalry [J].
Chen, Ming-Jun ;
Su, Che-Chun ;
Kwon, Do-Kyoung ;
Cormack, Lawrence K. ;
Bovik, Alan C. .
SIGNAL PROCESSING-IMAGE COMMUNICATION, 2013, 28 (09) :1143-1155
[5]   Light Field Compression Using Global Multiplane Representation and Two-Step Prediction [J].
Chen, Yilei ;
An, Ping ;
Huang, Xinpeng ;
Yang, Chao ;
Liu, Deyang ;
Wu, Qiang .
IEEE SIGNAL PROCESSING LETTERS, 2020, 27 :1135-1139
[6]   Blind Stereoscopic Video Quality Assessment: From Depth Perception to Overall Experience [J].
Chen, Zhibo ;
Zhou, Wei ;
Li, Weiping .
IEEE TRANSACTIONS ON IMAGE PROCESSING, 2018, 27 (02) :721-734
[7]   Light Field Super-Resolution By Jointly Exploiting Internal and External Similarities [J].
Cheng, Zhen ;
Xiong, Zhiwei ;
Liu, Dong .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGY, 2020, 30 (08) :2604-2616
[8]   Dense Light Field Coding: A Survey [J].
Conti, Caroline ;
Soares, Luis Ducla ;
Nunes, Paulo .
IEEE ACCESS, 2020, 8 :49244-49284
[9]  
Dai F, 2015, IEEE IMAGE PROC, P4733, DOI 10.1109/ICIP.2015.7351705
[10]   Image quality assessment based on a degradation model [J].
Damera-Venkata, N ;
Kite, TD ;
Geisler, WS ;
Evans, BL ;
Bovik, AC .
IEEE TRANSACTIONS ON IMAGE PROCESSING, 2000, 9 (04) :636-650