共 45 条
[31]
Dry etch damage in n-type crystalline silicon wafers assessed by deep-level transient spectroscopy and minority carrier lifetime
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
2018, 36 (04)
[32]
Z-scan measurement of optical nonlinearity in solid-state dye doped media
[J].
APPLIED PHYSICS B-LASERS AND OPTICS,
2007, 87 (01)
:145-149
[39]
Wu NX., 1991, P SOC PHOTO-OPT INS, V1519, P1527