A Numerical Framework for Entropy Generation Using Second-Order Nanofluid Thin Film Flow over an Expanding Sheet: Error Estimation and Stability Analysis

被引:10
作者
Zeeshan [1 ]
Attaullah [2 ]
Ahammad, N. Ameer [3 ]
Shah, Nehad Ali [4 ]
Chung, Jae Dong [4 ]
机构
[1] Bacha Khan Univ, Dept Math & Stat, Charsadda 24420, Pakistan
[2] Abdul Wali Khan Univ, Dept Math, Mardan 25000, Pakistan
[3] Univ Tabuk, Fac Sci, Dept Math, Tabuk 71491, Saudi Arabia
[4] Sejong Univ, Dept Mech Engn, Seoul 05006, South Korea
关键词
RK4; ND Solve method; second-grade nanofluid; stability analysis; error estimation; expanding sheet; magnetic field; BOUNDARY-LAYER-FLOW; NON-NEWTONIAN NANOFLUIDS; 2ND LAW ANALYSIS; HEAT-TRANSFER; LIQUID-FILM; THERMAL-RADIATION; CARREAU FLUID; PERISTALTIC TRANSPORT; FORCED-CONVECTION; STRETCHING SHEET;
D O I
10.3390/math11051078
中图分类号
O1 [数学];
学科分类号
0701 ; 070101 ;
摘要
Thin film flow (TFF) problems received a lot of attention in recent times. Some frequent applications of TFF include polymer and metal extraction, elastic sheet drawing, food striating, heat exchanges, and device fluidization. Further improvement and enhancement of TFF need to be examined due to its practical applications. In the current analysis, viscoelastic nanofluid thin film flow through the vertical expanding sheet in the presence of a magnetic field with entropy function has been examined. The governing equations are transformed to first-order ODEs through similarity transformation and then solved numerically by using RK4 along with the shooting technique and ND Solve method. The impact of embedded parameters is discussed using graphs and tables. Physical quantities of interest are also discussed in detail. For the numerical solution, the error estimation and the residue error are calculated for the stability and confirmation of the mathematical model.
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页数:26
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