C2DEM-YOLO: improved YOLOv8 for defect detection of photovoltaic cell modules in electroluminescence image

被引:24
作者
Zhu, Jiahao [1 ,2 ]
Zhou, Deqiang [1 ,2 ]
Lu, Rongsheng [3 ]
Liu, Xu [4 ]
Wan, Dahang [3 ,4 ]
机构
[1] Jiangnan Univ, Sch Mech Engn, Wuxi, Peoples R China
[2] Jiangsu Key Lab Adv Food Mfg Equipment & Technol, Wuxi, Peoples R China
[3] Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Hefei, Peoples R China
[4] Wedo Machine Vis Ind Technol Res Inst Co Ltd, Hefei, Peoples R China
关键词
Photovoltaic cell modules; defect detection; YOLOv8; attention mechanism; auxiliary regression boxes; SOLAR-CELLS;
D O I
10.1080/10589759.2024.2319263
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Photovoltaic (PV) cell modules are the core components of PV power generation systems, and defects in these modules can significantly affect photovoltaic conversion efficiency and lifespan. Electroluminescence (EL) testing is a method used to detect defects during the production process of these modules. To address the issue of low defect detection accuracy caused by the complex background and large-scale variations of EL images, we propose an object detection network named C2DEM-YOLO to improve the accuracy of defect detection. Firstly, a deep-shallow feature extraction module called C2Dense is designed to replace the C2f module in the YOLOv8's backbone. Secondly, a cross-space multi-scale attention(EMA) is introduced after C2Dense to apply pixel-level attention to the extracted features, which suppresses background information while enhancing useful features for defect detection. Finally, by replacing CIoU with Inner-CIoU, we introduce auxiliary regression boxes to improve the accuracy of detection and the generalisation ability of the model. Experimental results show that C2DEM-YOLO achieves an average precision of 92.31% on the PVEL-AD dataset, which has 2.41%, 1.93%, and 1.56% improvement compared to YOLOv5s, YOLOv8n, YOLOv8s, respectively. Moreover, on our self-built dataset, the mAP@0.5 and mAP@0.5:0.95 of C2DEM-YOLO are improved by 1.42% and 1.46% compared to YOLOv8n, reaching 84.07%.
引用
收藏
页码:309 / 331
页数:23
相关论文
共 40 条
[1]   Status and perspectives of crystalline silicon photovoltaics in research and industry [J].
Ballif, Christophe ;
Haug, Franz-Josef ;
Boccard, Mathieu ;
Verlinden, Pierre J. ;
Hahn, Giso .
NATURE REVIEWS MATERIALS, 2022, 7 (08) :597-616
[2]   Effect of surface texturization on minority carrier lifetime and photovoltaic performance of monocrystalline silicon solar cell [J].
Basher, M. K. ;
Hossain, M. Khalid ;
Akand, M. A. R. .
OPTIK, 2019, 176 :93-101
[3]   Detection of Surface Defects in Solar Cells by Bidirectional-Path Feature Pyramid Group-Wise Attention Detector [J].
Chen, Haiyong ;
Song, Mengyuan ;
Zhang, Zezhi ;
Liu, Kun .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 71
[4]   Solar cell surface defect inspection based on multispectral convolutional neural network [J].
Chen, Haiyong ;
Pang, Yue ;
Hu, Qidi ;
Liu, Kun .
JOURNAL OF INTELLIGENT MANUFACTURING, 2020, 31 (02) :453-468
[5]   Multi-scale YOLOv5 for solar cell defect detection [J].
Chen Y. ;
Liao F. ;
Huany X. ;
Yang J. ;
Gong H. .
Guangxue Jingmi Gongcheng/Optics and Precision Engineering, 2023, 31 (12) :1804-1815
[6]   Microcracks in Silicon Wafers I: Inline Detection and Implications of Crack Morphology on Wafer Strength [J].
Demant, Matthias ;
Welschehold, Tim ;
Oswald, Marcus ;
Bartsch, Sebastian ;
Brox, Thomas ;
Schoenfelder, Stephan ;
Rein, Stefan .
IEEE JOURNAL OF PHOTOVOLTAICS, 2016, 6 (01) :126-135
[7]   Nondestructive inspection, testing and evaluation for Si-based, thin film and multi junction solar cells: An overview [J].
Du, Bolun ;
Yang, Ruizhen ;
He, Yunze ;
Wang, Feng ;
Huang, Shoudao .
RENEWABLE & SUSTAINABLE ENERGY REVIEWS, 2017, 78 :1117-1151
[8]   Convolutional Neural Network based Efficient Detector for Multicrystalline Photovoltaic Cells Defect Detection [J].
Fu, Huan ;
Cheng, Guoqing .
ENERGY SOURCES PART A-RECOVERY UTILIZATION AND ENVIRONMENTAL EFFECTS, 2023, 45 (03) :8686-8702
[9]   Photographic surveying of minority carrier diffusion length in polycrystalline silicon solar cells by electroluminescence [J].
Fuyuki, T ;
Kondo, H ;
Yamazaki, T ;
Takahashi, Y ;
Uraoka, Y .
APPLIED PHYSICS LETTERS, 2005, 86 (26) :1-3
[10]  
Gevorgyan Z, 2022, Arxiv, DOI arXiv:2205.12740