Dynamic Behavior of Threshold Voltage and ID-VDS Kink in AlGaN/GaN HEMTs Due to Poole-Frenkel Effect

被引:2
|
作者
Gao, Zhan [1 ]
De Santi, Carlo [1 ]
Rampazzo, Fabiana [1 ]
Saro, Marco [1 ]
Fornasier, Mirko [1 ]
Meneghesso, Gaudenzio [1 ]
Meneghini, Matteo [2 ,3 ]
Chini, Alessandro [4 ]
Verzellesi, Giovanni [5 ]
Zanoni, Enrico [1 ]
机构
[1] Univ Padua, Dept Informat Engn, I-35131 Padua, Italy
[2] Univ Padua, Dept Informat Engn, I-35131 Padua, Italy
[3] Univ Padua, Dept Phys & Astron, I-35131 Padua, Italy
[4] Univ Modena & Reggio Emilia, Dept Engn Enzo Ferrari, I-41126 Modena, Italy
[5] Univ Modena & Reggio Emilia, Dept Sci & Methods Engn, I-41126 Modena, Italy
基金
欧盟地平线“2020”;
关键词
Current collapse; deep levels; GaN HEMT; GaN reliability; kink effect; ELECTRON-EMISSION; SURFACE-STATES; R-ON; GAN; FIELD; TRANSCONDUCTANCE; IMPACT; TRAPS; SI3N4; MODEL;
D O I
10.1109/TED.2023.3326781
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The kink effect in field-effect transistors (FETs) consists in a sudden increase in drain current, I-D, during a drain voltage sweep and leading to a higher I-D saturation value. We report new experimental data concerning the dynamic behavior of the "kink" in AlGaN/GaN HEMTs and correlate them with deep levels. The results demonstrate the role of the Poole-Frenkel effect in determining the occurrence of the kink and identify the experimental conditions that make it observable.
引用
收藏
页码:6256 / 6261
页数:6
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