共 13 条
- [1] Influence of Current Collapse due to Vds Bias Effect on GaN-HEMTs Id-Vds Characteristics in Saturation Region 2022 24TH EUROPEAN CONFERENCE ON POWER ELECTRONICS AND APPLICATIONS (EPE'22 ECCE EUROPE), 2022,
- [2] Incorporation of the Virtual Gate Effect and Consequences of its Neglect in the Simulation of ON-state ID-VDS Curves of AlGaN/GaN HEMTs 2018 IEEE BICMOS AND COMPOUND SEMICONDUCTOR INTEGRATED CIRCUITS AND TECHNOLOGY SYMPOSIUM (BCICTS), 2018, : 98 - 101
- [4] A Threshold Voltage Model for Charge Trapping Effect of AlGaN/GaN HEMTs IEEE ACCESS, 2019, 7 : 120638 - 120647
- [10] Modeling Buffer-Related Charge Trapping Effect by Using Threshold Voltage Shifts in AlGaN/GaN HEMTs 2018 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM - IMS, 2018, : 724 - 727