SIMPLY plus : A Reliable STT-MRAM-Based Smart Material Implication Architecture for In-Memory Computing

被引:1
|
作者
Moposita, Tatiana [1 ,2 ,3 ]
Garzon, Esteban [1 ]
de Rose, Raffaele [1 ]
Crupi, Felice [1 ]
Vladimirescu, Andrei [4 ,5 ]
Trojman, Lionel [2 ]
Lanuzza, Marco [1 ]
机构
[1] Univ Calabria UNICAL, Dept Comp Engn Modeling Elect & Syst Engn, I-87036 Arcavacata Di Rende, Italy
[2] Inst Super Elect Paris ISEP, Lab Informat Signal Image Telecommun & Elect, F-92130 Paris, France
[3] Sorbonne Univ, Fac Sci & Ingenierie, F-75006 Paris, France
[4] Univ Calif Berkeley, Dept Elect Engn & Comp Sci EECS, Berkeley, CA 94720 USA
[5] Delft Univ Technol TU Delft, Dept Elect Engn & Comp Sci EECS, NL-2628 CD Delft, Netherlands
关键词
Transistors; Reliability; Manganese; Computer architecture; Sensors; Integrated circuit reliability; Random access memory; Material Implication; SIMPLY; MTJ; STT-MRAM; in-memory computing; LOGIC GATES; DESIGN;
D O I
10.1109/ACCESS.2023.3344197
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This paper introduces SIMPLY+, an advanced Spin-Transfer Torque Magnetic Random-Access Memory (STT-MRAM)-based Logic-in-Memory (LIM) architecture that evolves from the previously proposed smart material implication (SIMPLY) logic scheme. More specifically, the latter is enhanced by incorporating additional circuitry to enhance the reliability of preliminary read operations. In this study, the proposed architecture is benchmarked against its conventional counterpart. Obtained results show a significant improvement in terms of reliability, i.e., the nominal read margin (RM) by a factor of $\sim 3 - 4\times $ and accordingly the bit error rate (BER) by more than four orders of magnitude. These improvements come at minimal cost in terms of circuit area and complexity compared to the conventional SIMPLY design. Overall, this research establishes SIMPLY+ as a promising solution for the design of reliable and energy-efficient in-memory computing architectures.
引用
收藏
页码:144084 / 144094
页数:11
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